Spatial and spectral wavefront analysis and measurement

ABSTRACT

A method and apparatus for wavefront analysis including obtaining a plurality of differently phase changed transformed wavefronts corresponding to a wavefront being analyzed which has an amplitude and a phase, obtaining a plurality of intensity maps of the plurality of phase changed transformed wavefronts and employing the plurality of intensity maps to obtain an output indicating the amplitude and phase of the wavefront being analyzed.

REFERENCE TO RELATED APPLICATIONS

This is a continuation of application No. 09/829,435 filed on Apr. 9,2001 now U.S. Pat. No. 6,819,435 which claims the benefit thereof andincorporates the same by reference. This application is based onprovisional application U.S. Ser. No. 60/196,862, filed on Apr. 12,2000.

FIELD OF THE INVENTION

The present invention relates to wavefront analysis generally and tovarious applications of wavefront analysis.

BACKGROUND OF THE INVENTION

The following patents and publications are believed to represent thecurrent state of the art:

U.S. Pat. Nos.:

-   5,969,855; 5,969,853; 5,936,253; 5,870,191; 5,814,815; 5,751,475;    5,619,372; 5,600,440; 5,471,303; 5,446,540; 5,235,587; 4,407,569;    4,190,366;    Non-U.S. patents:-   JP 9230247 (Abstract); JP 9179029 (Abstract); JP 8094936 (Abstract);    JP 7261089 (Abstract); JP 7225341 (Abstract); JP 6186504 (Abstract);    Other Publications:-   Phillion D. W. “General methods for generating phase-shifting    interferometry algorithms”—Applied Optics, Vol. 36, 8098 (1997).-   Pluta M. “Stray-light problem in phase contrast microscopy or toward    highly sensitive phase contrast devices: a review”—Optical    Engineering, Vol. 32, 3199 (1993).-   Noda T. and Kawata S. “Separation of phase and absorption images in    phase-contrast microscopy”—Journal of the Optical Society of America    A, Vol. 9., 924 (1992).-   Creath K. “Phase measurement interferometry techniques”—Progress in    Optics XXVI, 348 (1988).-   Greivenkamp J. E. “Generalized data reduction for heterodyne    interferometry”—Optical Engineering, Vol. 23, 350 (1984).-   Morgan C. J. “Least-squares estimation in phase-measurement    interferometry”—Optics Letters, Vol. 7, 368 (1982).-   Golden L. J. “Zernike test. 1: Analytical aspects”—Applied Optics,    Vol. 16, 205 (1977).-   Bruning J. H. et al. “Digital wavefront measuring interferometer for    testing optical surfaces and lenses”—Applied Optics, Vol. 13, 2693    (1974).

SUMMARY OF THE INVENTION

The present invention seeks to provide methodologies and systems forwavefront analysis as well as for surface mapping, phase changeanalysis, spectral analysis, object inspection, stored data retrieval,three-dimensional; imaging and other suitable applications utilizingwavefront analysis.

There is thus provided in accordance with a preferred embodiment of thepresent invention a method of wavefront analysis. The method includesobtaining a plurality of differently phase changed transformedwavefronts corresponding to a wavefront being analyzed which has anamplitude and a phase, obtaining a plurality of intensity maps of theplurality of phase changed transformed wavefronts and employing theplurality of intensity maps to obtain an output indicating the amplitudeand phase of the wavefront being analyzed.

There is also provided in accordance with a preferred embodiment of thepresent an apparatus for wavefront analysis including a wavefronttransformer operating to provide a plurality of differently phasechanged transformed wavefronts corresponding to a wavefront beinganalyzed which has an amplitude and a phase, an intensity map generatoroperating to provide a plurality of intensity maps of the plurality ofphase changed transformed wavefronts and an intensity map utilizer,employing the plurality of intensity maps for providing an outputindicating the amplitude and phase of the wavefront being analyzed.

Further in accordance with a preferred embodiment of the presentinvention the plurality of intensity maps are employed to provide ananalytical output indicating the amplitude and phase.

Still further in accordance with a preferred embodiment of the presentinvention the plurality of differently phase changed transformedwavefronts are obtained by interference of the wavefront being analyzedalong a common optical path.

Additionally in accordance with a preferred embodiment of the presentinvention the plurality of differently phase changed transformedwavefronts are realized in a manner substantially different fromperforming a delta-function phase change to the transformed wavefront.

Further in accordance with a preferred embodiment of the presentinvention the plurality of intensity maps are employed to obtain anoutput indicating the phase which is substantially free from halo andshading off distortions.

Preferably, the plurality of differently phase changed transformedwavefronts include a plurality of wavefronts resulting from at least oneof application of spatial phase changes to a transformed wavefront andtransforming of a wavefront following application of spatial phasechanges thereto.

Additionally in accordance with a preferred embodiment of the presentinvention, the step of obtaining a plurality of differently phasechanged transformed wavefronts includes applying a transform to thewavefront being analyzed thereby to obtain a transformed wavefront andapplying a plurality of different phase changes to the transformedwavefront, thereby to obtain a plurality of differently phase changedtransformed wavefronts. Preferably, the plurality of different phasechanges includes spatial phase changes and the plurality of differentspatial phase changes are effected by applying a time-varying spatialphase change to part of the transformed wavefront.

Further in accordance with a preferred embodiment of the presentinvention the plurality of different spatial phase changes are effectedby applying a spatially uniform, time-varying spatial phase change topart of the transformed wavefront. Preferably, the transform applied tothe wavefront being analyzed is a Fourier transform and wherein the stepof obtaining a plurality of intensity maps of the plurality of phasechanged transformed wavefronts includes applying a Fourier transform tothe plurality of differently phase changed transformed wavefronts.

Further in accordance with a preferred embodiment of the presentinvention the transform applied to the wavefront being analyzed is aFourier transform and the plurality of different spatial phase changesincludes at least three different phase changes. Preferably, theplurality of intensity maps includes at least three intensity maps andthe step of employing the plurality of intensity maps to obtain anoutput indicating the amplitude and phase of the wavefront beinganalyzed includes: expressing the wavefront being analyzed as a firstcomplex function which has an amplitude and phase identical to theamplitude and phase of the wavefront being analyzed, expressing theplurality of intensity maps as a function of the first complex functionand of a spatial function governing the spatially uniform, time-varyingspatial phase change, defining a second complex function, having anabsolute value and a phase, as a convolution of the first complexfunction and of a Fourier transform of the spatial function governingthe spatially uniform, time-varying spatial phase change. Expressingeach of the plurality of intensity maps as a third function of: theamplitude of the wavefront being analyzed, the absolute value of thesecond complex function, a difference between the phase of the wavefrontbeing analyzed and the phase of the second complex function and a knownphase delay produced by one of the at least three different phasechanges corresponding to one of the at least three intensity maps,solving the third function to obtain the amplitude of the wavefrontbeing analyzed, the absolute value of the second complex function andthe difference between the phase of the wavefront being analyzed and thephase of the second complex function, solving the second complexfunction to obtain the phase of the second complex function andobtaining the phase of the wavefront being analyzed by adding the phaseof the second complex function to the difference between the phase ofthe wavefront being analyzed and the phase of the second complexfunction.

Further in accordance with a preferred embodiment of the presentinvention the absolute value of the second complex function is obtainedby approximating the absolute value to a polynomial of a given degree.

Still further in accordance with a preferred embodiment of the presentinvention the second complex function is obtained by expressing thesecond complex function as an eigen-value problem where the complexfunction is an eigen-vector obtained by an iterative process.

Preferably the second complex function is obtained by: approximating theFourier transform of the spatial function governing the spatiallyuniform, time-varying spatial phase change to a polynomial andapproximating the second complex function to a polynomial.

Preferably, the wavefront being analyzed, the absolute value of thesecond complex function, and the difference between the phase of thesecond complex function and the phase of the wavefront being analyzed,are obtained by a least-square method, which has increased accuracy asthe number of the plurality of intensity maps increases.

Further in accordance with a preferred embodiment of the presentinvention the plurality of different phase changes includes at leastfour different phase changes, the plurality of intensity maps includesat least four intensity maps and employing the plurality of intensitymaps to obtain an output indicating the amplitude and phase of thewavefront being analyzed and includes: expressing each of the pluralityof intensity maps as a third function of: the amplitude of the wavefrontbeing analyzed, the absolute value of the second complex function, adifference between the phase of the wavefront being analyzed and thephase of the second complex function, a known phase delay produced byone of the at least four different phase changes in which eachcorresponds to one of the at least four intensity maps and at least oneadditional unknown relating to the wavefront analysis, where the numberof the at least one additional unknown is no greater than the number bywhich the plurality intensity maps exceeds three and solving the thirdfunction to obtain the amplitude of the wavefront being analyzed, theabsolute value of the second complex function, the difference betweenthe phase of the wavefront being analyzed and the phase of the secondcomplex function and the additional unknown.

Further in accordance with a preferred embodiment of the presentinvention the phase changes are chosen as to maximize contrast in theintensity maps and to minimize effects of noise on the phase of thewavefront being analyzed.

Preferably, expressing each of the plurality of intensity maps as athird function of: the amplitude of the wavefront being analyzed, theabsolute value of the second complex function, a difference between thephase of the wavefront being analyzed and the phase of the secondcomplex function and a known phase delay produced by one of the at leastthree different phase changes which corresponds to one of the at leastthree intensity maps and includes: defining fourth, fifth and sixthcomplex functions, none of which being a function of any of theplurality of intensity maps or of the time-varying spatial phase change,each of the fourth, fifth and sixth complex functions being a functionof the amplitude of the wavefront being analyzed, the absolute value ofthe second complex function and the difference between the phase of thewavefront being analyzed and the phase of the second complex functionand expressing each of the plurality of intensity maps as a sum of thefourth complex function, the fifth complex function multiplied by thesine of the known phase delay corresponding to each one of the pluralityof intensity maps and the sixth complex function multiplied by thecosine of the known phase delay corresponding to each one of theplurality of intensity maps.

Preferably, the step of solving the third function to obtain theamplitude of the wavefront being analyzed, the absolute value of thesecond complex function and the difference between the phase of thewavefront being analyzed and the phase of the second complex functionincludes: obtaining two solutions for each of the amplitude of thewavefront being analyzed, the absolute value of the second complexfunction and the difference between the phase of the wavefront beinganalyzed and the phase of the second complex function, the two solutionsbeing a higher value solution and a lower value solution, combining thetwo solutions into an enhanced absolute value solution for the absolutevalue of the second complex function, by choosing at each spatiallocation either the higher value solution or the lower value solution ofthe two solutions in a way that the enhanced absolute value solutionsatisfies the second complex function. Preferably, combining the twosolutions of the amplitude of the wavefront being analyzed into enhancedamplitude solution, by choosing at each spatial location the highervalue solution or the lower value solution of the two solutions of theamplitude in the way that at each location where the higher valuesolution is chosen for the absolute value solution, the higher valuesolution is chosen for the amplitude solution and at each location wherethe lower value solution is chosen for the absolute value solution, thelower value solution is chosen for the amplitude solution, combining thetwo solutions of the difference between the phase of the wavefront beinganalyzed and the phase of the second complex function into an enhanceddifference solution, by choosing at each spatial location the highervalue solution or the lower value solution of the two solutions of thedifference in the way that at each location where the higher valuesolution is chosen for the absolute value solution, the higher valuesolution is chosen for the difference solution and at each locationwhere the lower value solution is chosen for the absolute valuesolution, the lower value solution is chosen for the differencesolution.

Further in accordance with a preferred embodiment of the presentinvention the spatially uniform, time-varying spatial phase change isapplied to a spatially central part of the transformed wavefront.

Preferably, the transform applied to the wavefront being analyzed is aFourier transform and wherein the step of obtaining a plurality ofintensity maps of the plurality of phase changed transformed wavefrontsincludes applying a Fourier transform to the plurality of differentlyphase changed transformed wavefronts.

Still further in accordance with a preferred embodiment of the presentinvention the method also includes adding a phase component includingrelatively high frequency components to the wavefront being analyzedprior to applying the transform thereto in order to increase thehigh-frequency content of the transformed wavefront prior to theapplying the spatially uniform, time-varying spatial phase change topart of the transformed wavefront.

Preferably, the spatially uniform, time-varying spatial phase change isapplied to a spatially centered generally circular region of thetransformed wavefront and the spatially uniform, time-varying spatialphase change is applied to approximately one half of the transformedwavefront.

Additionally in accordance with a preferred embodiment of the presentinvention the transformed wavefront includes a DC region and a non-DCregion and the spatially uniform, time-varying spatial phase change isapplied to at least part of both the DC region and the non-DC region.

Further in accordance with a preferred embodiment of the presentinvention the plurality of differently phase changed transformedwavefronts include a plurality of wavefronts whose phase has beenchanged by employing an at least time varying phase change function.Alternatively, the plurality of differently phase changed transformedwavefronts include a plurality of wavefronts whose phase has beenchanged by applying an at least time varying phase change function tothe wavefront being analyzed.

Preferably, the at least time varying phase change function is appliedto the wavefront being analyzed prior to transforming thereof.Alternatively, the at least time varying phase change function isapplied to the wavefront being analyzed subsequent to transformingthereof.

Further in accordance with a preferred embodiment of the presentinvention the plurality of differently phase changed transformedwavefronts include a plurality of wavefronts whose phase has beenchanged by employing an at least time varying phase change function.

Additionally or alternatively, the plurality of differently phasechanged transformed wavefronts include a plurality of wavefronts whosephase has been changed by applying an at least time varying phase changefunction to the wavefront to be analyzed.

Preferably, the at least time varying phase change function is aspatially uniform spatial function.

Additionally in accordance with a preferred embodiment of the presentinvention the transformed wavefront includes a plurality of differentwavelength components and the plurality of different spatial phasechanges are effected by applying a phase change to the plurality ofdifferent wavelength components of the transformed wavefront.

Preferably, the phase change applied to the plurality of differentwavelength components of the transformed wavefront is a time-varyingspatial phase change.

Further in accordance with a preferred embodiment of the presentinvention the phase change applied to the plurality of differentwavelength components of the transformed wavefront is effected bypassing the transformed wavefront through an object, at least one ofwhose thickness and refractive index varies spatially.

Still further in accordance with a preferred embodiment of the presentinvention the phase change applied to the plurality of differentwavelength components of the transformed wavefront is effected byreflecting the transformed wavefront from a spatially varying surface.

Further in accordance with a preferred embodiment of the presentinvention the phase change applied to the plurality of differentwavelength components of the transformed wavefront is selected to bedifferent to a predetermined extent for at least some of the pluralityof different wavelength components.

Additionally in accordance with a preferred embodiment of the presentinvention the phase change applied to the plurality of differentwavelength components of the transformed wavefront is identical for atleast some of the plurality of different wavelength components.

Further in accordance with a preferred embodiment of the presentinvention the wavefront being analyzed includes a plurality of differentwavelength components.

Preferably, the plurality of differently phase changed transformedwavefronts are obtained by applying a phase change to the plurality ofdifferent wavelength components of the wavefront being analyzed.

Preferably, the phase change is applied to the plurality of differentwavelength components of the wavefront being analyzed prior totransforming thereof.

Further in accordance with a preferred embodiment of the presentinvention the phase change applied to the plurality of differentwavelength components is effected by passing the wavefront beinganalyzed through an object, at least one of whose thickness andrefractive index varies spatially.

Further in accordance with a preferred embodiment of the presentinvention the step of obtaining a plurality of intensity maps isperformed simultaneously for all of the plurality of differentwavelength components and obtaining a plurality of intensity mapsincludes dividing the plurality of phase changed transformed wavefrontsinto separate wavelength components.

Still further in accordance with a preferred embodiment of the presentinvention the step of dividing the plurality of phase changedtransformed wavefronts is effected by passing the plurality of phasechanged transformed wavefronts through a dispersion element.

Additionally in accordance with a preferred embodiment of the presentinvention the phase change applied to the plurality of differentwavelength components is effected by passing the wavefront beinganalyzed through an object, at least one of whose thickness andrefractive index varies spatially, following transforming of thewavefront being analyzed.

Preferably, the phase change which is applied to the plurality ofdifferent wavelength components is effected by reflecting the wavefrontbeing analyzed from a spatially varying surface, following transformingof the wavefront being analyzed.

Further in accordance with a preferred embodiment of the presentinvention the phase change applied to the plurality of differentwavelength components is selected to be different to a predeterminedextent for at least some of the plurality of different wavelengthcomponents. Preferably, the phase change which is applied to theplurality of different wavelength components is identical for at leastsome of the plurality of different wavelength components.

Further in accordance with a preferred embodiment of the presentinvention the phase change applied to the plurality of differentwavelength components is effected by passing the wavefront beinganalyzed through a plurality of objects, each characterized in that atleast one of its thickness and refractive index varies spatially.

Preferably, the phase change applied to the plurality of differentwavelength components is effected by passing the wavefront beinganalyzed through a plurality of objects, each characterized in that atleast one of its thickness and refractive index varies spatially,following transforming of the wavefront being analyzed.

Further in accordance with a preferred embodiment of the presentinvention the wavefront being analyzed includes a plurality of differentpolarization components and the plurality of differently phase changedtransformed wavefronts are obtained by applying a phase change to theplurality of different polarization components of the wavefront beinganalyzed prior to transforming thereof.

Still further in accordance with a preferred embodiment of the presentinvention the transformed wavefront includes a plurality of differentpolarization components and the plurality of different spatial phasechanges are effected by applying a phase change to the plurality ofdifferent polarization components of the transformed wavefront.

Additionally in accordance with a preferred embodiment of the presentinvention the phase change applied to the plurality of differentpolarization components of the transformed wavefront is different for atleast some of the plurality of different polarization components.

Further in accordance with a preferred embodiment of the presentinvention the phase change applied to the plurality of differentpolarization components of the transformed wavefront is identical for atleast some of the plurality of different polarization components.

Additionally in accordance with a preferred embodiment of the presentinvention the step of obtaining a plurality of intensity maps of theplurality of phase changed transformed wavefronts includes applying atransform to the plurality of differently phase changed transformedwavefronts.

Preferably, the plurality of phase changed transformed wavefronts arereflected from a reflecting surface so that the transform applied to theplurality of differently phase changed transformed wavefronts isidentical to the transform applied to the wavefront being analyzed.

Further in accordance with a preferred embodiment of the presentinvention the transform applied to the wavefront being analyzed is aFourier transform.

Still further in accordance with a preferred embodiment of the presentinvention the plurality of intensity maps are obtained by reflecting theplurality of differently phase changed transformed wavefronts from areflecting surface so as to transform the plurality of differently phasechanged transformed wavefronts.

Additionally in accordance with a preferred embodiment of the presentinvention the method of obtaining a plurality of intensity maps of theplurality of phase changed transformed wavefronts includes applying atransform to the plurality of differently phase changed transformedwavefronts.

Further in accordance with a preferred embodiment of the presentinvention the method of employing the plurality of intensity maps toobtain an output indicating the amplitude and phase of the wavefrontbeing analyzed includes expressing the plurality of intensity maps as atleast one mathematical function of phase and amplitude of the wavefrontbeing analyzed and employing the at least one mathematical function toobtain an output indicating the phase and amplitude.

Preferably, the method of employing the plurality of intensity maps toobtain an output indicating the amplitude and phase of the wavefrontbeing analyzed includes expressing the plurality of intensity maps as atleast one mathematical function of phase and amplitude of the wavefrontbeing analyzed and of the plurality of different phase changes, whereinthe phase and amplitude are unknowns and the plurality of differentphase changes are known and employing the at least one mathematicalfunction to obtain an output indicating the phase and amplitude.

Further in accordance with a preferred embodiment of the presentinvention the plurality of intensity maps includes at least fourintensity maps and employing the plurality of intensity maps to obtainan output indicating the amplitude and phase of the wavefront beinganalyzed, includes employing a plurality of combinations, each of atleast three of the plurality of intensity maps, to provide a pluralityof indications of the amplitude and phase of the wavefront beinganalyzed.

Preferably, the method also includes employing the plurality ofindications of the amplitude and phase of the wavefront being analyzedto provide an enhanced indication of the amplitude and phase of thewavefront being analyzed.

Further in accordance with a preferred embodiment of the presentinvention at least some of the plurality of indications of the amplitudeand phase are at least second order indications of the amplitude andphase of the wavefront being analyzed.

Further in accordance with a preferred embodiment of the presentinvention the step of obtaining a plurality of differently phase changedtransformed wavefronts includes applying a transform to the wavefrontbeing analyzed, thereby obtaining a transformed wavefront and applying aplurality of different phase and amplitude changes to the transformedwavefront, thereby obtaining a plurality of differently phase andamplitude changed transformed wavefronts.

Further in accordance with a preferred embodiment of the presentinvention the plurality of different phase and amplitude changesincludes at least three different phase and intensity changes, theplurality of different phase and amplitude changes are effected byapplying at least one of a spatially uniform, time-varying spatial phasechange and a spatially uniform, time-varying spatial amplitude change toat least part of the transformed wavefront, the plurality of intensitymaps includes at least three intensity maps. Preferably, the step ofemploying the plurality of intensity maps to obtain an output indicatingthe amplitude and phase of the wavefront being analyzed includes:expressing the wavefront being analyzed as a first complex functionwhich has an amplitude and phase identical to the amplitude and phase ofthe wavefront being analyzed, expressing the plurality of intensity mapsas a function of the first complex function and of a spatial functiongoverning at least one of a spatially uniform, time-varying spatialphase change and a spatially uniform, time-varying spatial amplitudechange, defining a second complex function having an absolute value anda phase as a convolution of the first complex function and of a Fouriertransform of the spatial function governing the spatially uniform,time-varying spatial phase change, expressing each of the plurality ofintensity maps as a third function of: the amplitude of the wavefrontbeing analyzed, the absolute value of the second complex function and adifference between the phase of the wavefront being analyzed and thephase of the second complex function. Preferably, the spatial functiongoverning at least one of a spatially uniform, time-varying spatialphase change and a spatially uniform, time-varying spatial amplitudechange includes: defining fourth, fifth, sixth and seventh complexfunctions, none of which is a function of any of the plurality ofintensity maps or of the time-varying spatial phase change. Preferably,each of the fourth, fifth, sixth and seventh complex functions being afunction of at least one of: the amplitude of the wavefront beinganalyzed, the absolute value of the second complex function and thedifference between the phase of the wavefront being analyzed and thephase of the second complex function, defining an eighth function of aphase delay and of an amplitude change, both produced by one of the atleast three different phase and amplitude changes, corresponding to theat least three intensity maps and expressing each of the plurality ofintensity maps as a sum of the fourth complex function, the fifthcomplex function multiplied by the absolute value squared of the eighthfunction, the sixth complex function multiplied by the eighth functionand the seventh complex function multiplied by the complex conjugate ofthe eighth function, solving the third function to obtain the amplitudeof the wavefront being analyzed, the absolute value of the secondcomplex function and the difference between the phase of the wavefrontbeing analyzed and the phase of the second complex function, solving thesecond complex function to obtain the phase of the second complexfunction and obtaining the phase of the wavefront being analyzed byadding the phase of the second complex function to the differencebetween the phase of the wavefront being analyzed and phase of thesecond complex function.

Further in accordance with a preferred embodiment of the presentinvention the wavefront being analyzed includes at least two wavelengthcomponents. Preferably, the step of obtaining a plurality of intensitymaps also includes dividing the phase changed transformed wavefrontsaccording to the at least two wavelength components in order to obtainat least two wavelength components of the phase changed transformedwavefronts and in order to obtain at least two sets of intensity maps,each set corresponding to a different one of the at least two wavelengthcomponents of the phase changed transformed wavefronts and employing theplurality of intensity maps to obtain an output indicating the amplitudeand phase of the wavefront being analyzed, obtaining an outputindicative of the phase of the wavefront being analyzed from each of theat least two sets of intensity maps and combining the outputs to providean enhanced indication of phase of the wavefront being analyzed, inwhich enhanced indication, there is no 2π ambiguity.

Additionally in accordance with a preferred embodiment of the presentinvention the wavefront being analyzed is an acoustic radiationwavefront.

Still further in accordance with a preferred embodiment of the presentinvention the wavefront being analyzed includes at least oneone-dimensional component, the transform applied to the wavefront beinganalyzed is a one-dimensional Fourier transform, performed in adimension perpendicular to a direction of propagation of the wavefrontbeing analyzed, thereby to obtain at least one one-dimensional componentof the transformed wavefront in the dimension perpendicular to thedirection of propagation. The plurality of differently phase changedtransformed wavefronts are obtained by applying the plurality ofdifferent phase changes to each of the at least one one-dimensionalcomponent, thereby obtaining at least one one-dimensional component ofthe plurality of phase changed transformed wavefronts and the pluralityof intensity maps are employed to obtain an output indicating amplitudeand phase of the at least one one-dimensional component of the wavefrontbeing analyzed.

Preferably, the plurality of different phase changes is applied to eachof the one-dimensional component by providing a relative movementbetween the wavefront being analyzed and an element. Preferably, theelement generates spatially varying, time-constant phase changes, therelative movement being in an additional dimension which isperpendicular both to the direction of propagation and to the dimensionperpendicular to the direction of propagation.

Further in accordance with a preferred embodiment of the presentinvention the wavefront being analyzed includes a plurality of differentwavelength components, the plurality of different phase changes areapplied to the plurality of different wavelength components of each ofthe plurality of one-dimensional components of the wavefront beinganalyzed and the step of obtaining a plurality of intensity mapsincludes dividing the plurality of one-dimensional components of theplurality of phase changed transformed wavefronts into separatewavelength components.

Still further in accordance with a preferred embodiment of the presentinvention dividing the plurality of one-dimensional components of theplurality of phase changed transformed wavefronts into separatewavelength components is achieved by passing the plurality of phasechanged transformed wavefronts through a dispersion element.

Further in accordance with a preferred embodiment of the presentinvention the transform applied to the wavefront being analyzed includesan additional Fourier transform to minimize cross-talk between differentone-dimensional components of the wavefront being analyzed.

There is provided in accordance with another preferred embodiment of thepresent invention a method of surface mapping. The method includesobtaining a surface mapping wavefront having an amplitude and a phase,by reflecting radiation from a surface and analyzing the surface mappingwavefront by: obtaining a plurality of differently phase changedtransformed wavefronts corresponding to the surface mapping wavefront,obtaining a plurality of intensity maps of the plurality of phasechanged transformed wavefronts and employing the plurality of intensitymaps to obtain an output indicating the amplitude and phase of thesurface mapping wavefront.

There is further provided in accordance with a preferred embodiment ofthe present invention an apparatus for surface mapping. The apparatusincludes a wavefront obtainer operating to obtain a surface mappingwavefront having an amplitude and a phase, by reflecting radiation froma surface, a wavefront analyzer, analyzing the surface mapping wavefrontand including a wavefront transformer operating to provide a pluralityof differently phase changed transformed wavefronts corresponding to thesurface mapping wavefront, an intensity map generator operating toprovide a plurality of intensity maps of the plurality of phase changedtransformed wavefronts and an intensity map utilizer, the plurality ofintensity maps provide an output indicating the amplitude and phase ofthe surface mapping wavefront.

Further in accordance with a preferred embodiment of the presentinvention the radiation reflected from the surface has a narrow bandabout a given wavelength, causing the phase of the surface mappingwavefront to be proportional to geometrical variations in the surface,the proportion being an inverse linear function of the wavelength.

Still further in accordance with a preferred embodiment of the presentinvention the radiation reflected from the surface has at least twonarrow bands, each centered about a different wavelength, providing atleast two wavelength components in the surface mapping wavefront and atleast two indications of the phase of the surface mapping wavefront,thereby enabling an enhanced mapping of the surface to be obtained byavoiding an ambiguity in the mapping which exceeds the larger of thedifferent wavelengths about which the two narrow bands are centered.

Additionally in accordance with a preferred embodiment of the presentinvention the step of obtaining a plurality of differently phase changedtransformed wavefronts includes applying a transform to the surfacemapping wavefront, thereby to obtain a transformed wavefront andapplying a plurality of different phase changes, including spatial phasechanges, to the transformed wavefront, thereby to obtain a plurality ofdifferently phase changed transformed wavefronts.

Further in accordance with a preferred embodiment of the presentinvention the transform applied to the surface mapping wavefront is aFourier transform, the plurality of different phase changes includes atleast three different phase changes, effected by applying a spatiallyuniform, time-varying spatial phase change to part of the transformedwavefront, the plurality of intensity maps includes at least threeintensity maps. Preferably, the step of employing the plurality ofintensity maps to obtain an output indicates the amplitude and phase ofthe surface mapping wavefront and includes expressing the surfacemapping wavefront as a first complex function which has an amplitude andphase identical to the amplitude and phase of the surface mappingwavefront, expressing the plurality of intensity maps as a function ofthe first complex function and of a spatial function governing thespatially uniform, time-varying spatial phase change, defining a secondcomplex function having an absolute value and a phase as a convolutionof the first complex function and of a Fourier transform of the spatialfunction governing the spatially uniform, time-varying spatial phasechange. Preferably, expressing each of the plurality of intensity mapsas a third function of: the amplitude of the surface mapping wavefront,the absolute value of the second complex function, a difference betweenthe phase of the surface mapping wavefront and the phase of the secondcomplex function and a known phase delay produced by one of the at leastthree different phase changes, corresponding to one of the at leastthree intensity maps, solving the third function to obtain the amplitudeof the surface mapping wavefront, the absolute value of the secondcomplex function and the difference between the phase of the surfacemapping wavefront and the phase of the second complex function, solvingthe second complex function to obtain the phase of the second complexfunction and obtaining the phase of the surface mapping wavefront byadding the phase of the second complex function to the differencebetween the phase of the surface mapping wavefront and phase of thesecond complex function.

Preferably, the surface mapping wavefront includes a plurality ofdifferent wavelength components. The plurality of differently phasechanged transformed wavefronts are preferably obtained by: transformingthe surface mapping wavefront thereby obtaining a transformed wavefrontincluding a plurality of different wavelength components and applying aphase change to the plurality of different wavelength components of thetransformed wavefront by passing the transformed wavefront through anobject, at least one of whose thickness and refractive index variesspatially.

There is also provided in accordance with yet another preferredembodiment of the present invention a method of inspecting an object.The method includes obtaining an object inspection wavefront which hasan amplitude and a phase, by transmitting radiation through the objectand analyzing the object inspection wavefront by: obtaining a pluralityof differently phase changed transformed wavefronts corresponding to theobject inspection wavefront, obtaining a plurality of intensity maps ofthe plurality of phase changed transformed wavefronts and employing theplurality of intensity maps to obtain an output indicating the amplitudeand phase of the object inspection wavefront.

There is further provided in accordance with a preferred embodiment ofthe present invention an apparatus for inspecting an object. Theapparatus includes a wavefront obtainer operating to obtain an objectinspection wavefront which has an amplitude and a phase, by transmittingradiation through the object, a wavefront analyzer, analyzing the objectinspection wavefront and including a wavefront transformer operating toprovide a plurality of differently phase changed transformed wavefrontscorresponding to the object inspection wavefront, an intensity mapgenerator operating to provide a plurality of intensity maps of theplurality of phase changed transformed wavefronts and an intensity maputilizer, employing the plurality of intensity maps to provide an outputindicating the amplitude and phase of the object inspection wavefront.

Preferably, when the object is substantially uniform in material andother optical properties, the phase of the object inspection wavefrontis proportional to the object thickness.

Additionally, when the object is substantially uniform in thickness, thephase of the object inspection wavefront is proportional to opticalproperties of the object.

Further in accordance with a preferred embodiment of the presentinvention the radiation has at least two narrow bands, each centeredabout a different wavelength, providing at least two wavelengthcomponents in the object inspection wavefront and at least twoindications of the phase of the object inspection wavefront, therebyenabling an enhanced mapping of thickness of the object to be inspectedby avoiding an ambiguity in the mapping which exceeds the larger of thedifferent wavelengths about which the two narrow bands are centered.

Still further in accordance with a preferred embodiment of the presentinvention the method of obtaining a plurality of differently phasechanged transformed wavefronts includes applying a transform to theobject inspection wavefront, thereby obtaining a transformed wavefrontand applying a plurality of different phase changes, including spatialphase changes, to the transformed wavefront, thereby obtaining aplurality of differently phase changed transformed wavefronts.

Further in accordance with a preferred embodiment of the presentinvention the transform applied to the object inspection wavefront is aFourier transform, the plurality of different phase changes includes atleast three different phase changes, effected by applying a spatiallyuniform, time-varying spatial phase change to part of the transformedwavefront. Preferably, the plurality of intensity maps includes at leastthree intensity maps and employing the plurality of intensity maps toobtain an output indicating the amplitude and phase of the objectinspection wavefront and includes: expressing the object inspectionwavefront as a first complex function which has an amplitude and phaseidentical to the amplitude and phase of the object inspection wavefront,expressing the plurality of intensity maps as a function of the firstcomplex function and of a spatial function governing the spatiallyuniform, time-varying spatial phase change, defining a second complexfunction having an absolute value and a phase as a convolution of thefirst complex function and of a Fourier transform of the spatialfunction governing the spatially uniform, time-varying spatial phasechange, expressing each of the plurality of intensity maps as a thirdfunction of: the amplitude of the object inspection wavefront, theabsolute value of the second complex function, a difference between thephase of the object inspection wavefront and the phase of the secondcomplex function and a known phase delay produced by one of the at leastthree different phase changes, corresponding to one of the at leastthree intensity maps, solving the third function to obtain the amplitudeof the object inspection wavefront, the absolute value of the secondcomplex function and the difference between the phase of the objectinspection wavefront and the phase of the second complex function,solving the second complex function to obtain the phase of the secondcomplex function and obtaining the phase of the object inspectionwavefront by adding the phase of the second complex function to thedifference between the phase of the object inspection wavefront andphase of the second complex function.

Still further in accordance with a preferred embodiment of the presentinvention the object inspection wavefront includes a plurality ofdifferent wavelength components. The plurality of differently phasechanged transformed wavefronts are preferably obtained by: transformingthe object inspection wavefront thereby obtaining a transformedwavefront including a plurality of different wavelength components andapplying a phase change to the plurality of different wavelengthcomponents of the transformed wavefront by reflecting the transformedwavefront from a spatially varying surface.

There is also provided in accordance with yet another preferredembodiment of the present invention a method of spectral analysis. Themethod includes obtaining a spectral analysis wavefront having anamplitude and a phase, by causing radiation to impinge on an object,analyzing the spectral analysis wavefront by: obtaining a plurality ofdifferently phase changed transformed wavefronts corresponding to thespectral analysis wavefront which has an amplitude and a phase,obtaining a plurality of intensity maps of the plurality of phasechanged transformed wavefronts and employing the plurality of intensitymaps to obtain an output indicating the amplitude and phase of thespectral analysis wavefront and employing the output indicating theamplitude and phase to obtain an output indicating spectral content ofthe radiation.

There is provided in accordance with a further preferred embodiment ofthe present invention an apparatus for spectral analysis. The apparatusincludes a wavefront obtainer operating to obtain a spectral analysiswavefront having an amplitude and a phase, by causing radiation toimpinge on an object, a wavefront analyzer, analyzing the spectralanalysis wavefront, including a wavefront transformer operating toprovide a plurality of differently phase changed transformed wavefrontscorresponding to the spectral analysis wavefront which has an amplitudeand a phase, an intensity map generator operating to provide a pluralityof intensity maps of the plurality of phase changed transformedwavefronts, an intensity map utilizer, employing the plurality ofintensity maps to provide an output indicating the amplitude and phaseof the spectral analysis wavefront and a phase and amplitude utilizer,employing the output indicating the amplitude and phase to obtain anoutput indicating spectral content of the radiation.

Further in accordance with a preferred embodiment of the presentinvention and wherein obtaining the spectral analysis wavefront iseffected by reflecting the radiation from the object.

Still further in accordance with a preferred embodiment of the presentinvention and wherein obtaining the spectral analysis wavefront iseffected by transmitting the radiation through the object.

Additionally in accordance with a preferred embodiment of the presentinvention the radiation is substantially of a single wavelength, thephase of the spectral analysis wavefront is inversely proportional tothe single wavelength, and is related to at least one of a surfacecharacteristic and thickness of the impinged object.

Still further in accordance with a preferred embodiment of the presentinvention the step of employing the plurality of intensity maps toobtain an output indicating the amplitude and phase of the spectralanalysis wavefront includes: expressing the plurality of intensity mapsas at least one mathematical function of phase and amplitude of thespectral analysis wavefront and of the plurality of different phasechanges, wherein at least the phase is unknown and a function generatingthe plurality of phase changed transformed wavefronts is known andemploying the at least one mathematical function to obtain an outputindicating at least the phase.

Additionally in accordance with a preferred embodiment of the presentinvention the step of obtaining a plurality of differently phase changedtransformed wavefronts includes applying a transform to the spectralanalysis wavefront, thereby obtaining a transformed wavefront andapplying a plurality of different phase changes, including spatial phasechanges, to the transformed wavefront, thereby obtaining a plurality ofdifferently phase changed transformed wavefronts.

Further in accordance with a preferred embodiment of the presentinvention the transform applied to the spectral analysis wavefront is aFourier transform, the plurality of different phase changes includes atleast three different phase changes, effected by applying a spatiallyuniform, time-varying spatial phase change to part of the transformedwavefront. Preferably, the plurality of intensity maps includes at leastthree intensity maps and employing the plurality of intensity maps toobtain an output indicating the amplitude and phase of the spectralanalysis wavefront includes: expressing the spectral analysis wavefrontas a first complex function which has an amplitude and phase identicalto the amplitude and phase of the spectral analysis wavefront,expressing the plurality of intensity maps as a function of the firstcomplex function and of a spatial function governing the spatiallyuniform, time-varying spatial phase change, defining a second complexfunction having an absolute value and a phase as a convolution of thefirst complex function and of a Fourier transform of the spatialfunction governing the spatially uniform, time-varying spatial phasechange, expressing each of the plurality of intensity maps as a thirdfunction of: the amplitude of the spectral analysis wavefront, theabsolute value of the second complex function, a difference between thephase of the spectral analysis wavefront and the phase of the secondcomplex function and a known phase delay produced by one of the at leastthree different phase changes, corresponding to one of the at leastthree intensity maps, solving the third function to obtain the amplitudeof the spectral analysis wavefront, the absolute value of the secondcomplex function and the difference between the phase of the spectralanalysis wavefront and the phase of the second complex function, solvingthe second complex function to obtain the phase of the second complexfunction and obtaining the phase of the spectral analysis wavefront byadding the phase of the second complex function to the differencebetween the phase of the spectral analysis wavefront and phase of thesecond complex function.

Further in accordance with a preferred embodiment of the presentinvention the spectral analysis wavefront includes a plurality ofdifferent wavelength components and the plurality of differently phasechanged transformed wavefronts are obtained by applying a phase changeto the plurality of different wavelength components of the spectralanalysis wavefront.

There is further provided in accordance with a preferred embodiment ofthe present invention a method of phase change analysis. The methodincludes obtaining a phase change analysis wavefront which has anamplitude and a phase, applying a transform to the phase change analysiswavefront thereby to obtain a transformed wavefront, applying aplurality of different phase changes to the transformed wavefront,thereby to obtain a plurality of differently phase changed transformedwavefronts, obtaining a plurality of intensity maps of the plurality ofphase changed transformed wavefronts and employing the plurality ofintensity maps to obtain an output indication of differences between theplurality of different phase changes applied to the transformed phasechange analysis wavefront.

There is also provided in accordance with yet another preferredembodiment of the present invention an apparatus for phase changeanalysis. The apparatus includes a wavefront obtainer, operating toobtain a phase change analysis wavefront which has an amplitude and aphase, a transform applier, applying a transform to the phase changeanalysis wavefront thereby to obtain a transformed wavefront, a phasechange applier, applying at least one phase change to the transformedwavefront, thereby to obtain at least one phase changed transformedwavefront, an intensity map generator operating to provide at least oneintensity map of the phase changed transformed wavefront and anintensity map utilizer, employing the plurality of intensity maps toprovide an output indication of differences between the plurality ofdifferent phase changes applied to the transformed phase change analysiswavefront.

Typically, when lateral shifts appear in the plurality of differentphase changes, corresponding changes appear in the plurality ofintensity maps and the step of employing the plurality of intensity mapsresults in obtaining an indication of the lateral shifts.

Still further in accordance with a preferred embodiment of the presentinvention the step of employing the plurality of intensity maps toobtain an output indication of differences between the plurality ofdifferent phase changes applied to the transformed phase change analysiswavefront includes: expressing the plurality of intensity maps as atleast one mathematical function of phase and amplitude of the phasechange analysis wavefront and of the plurality of different phasechanges, where at least the phase and amplitude are known and theplurality of different phase changes are unknown and employing themathematical function to obtain an output indicating the differencesbetween the plurality of different phase changes.

There is further provided in accordance with yet a further preferredembodiment of the present invention a method of phase change analysis.The method includes obtaining a phase change analysis wavefront whichhas an amplitude and a phase, applying a transform to the phase changeanalysis wavefront thereby to obtain a transformed wavefront, applyingat least one phase change to the transformed wavefront, thereby toobtain at least one phase changed transformed wavefront, obtaining atleast one intensity map of the at least one phase changed transformedwavefront and employing the intensity map to obtain an output indicationof the at least one phase change applied to the transformed phase changeanalysis wavefront.

There is also provided in accordance with yet another preferredembodiment of the present invention an apparatus for phase changeanalysis. The apparatus includes a wavefront obtainer, operating toobtain a phase change analysis wavefront which has an amplitude and aphase, a transform applier, applying a transform to the phase changeanalysis wavefront thereby to obtain a transformed wavefront, a phasechange applier, applying at least one phase change to the transformedwavefront, thereby to obtain at least one phase changed transformedwavefront, an intensity map generator operating to provide at least oneintensity map of the phase changed transformed wavefront and anintensity map utilizer, employing the intensity map to provide an outputindication of the phase change applied to the transformed phase changeanalysis wavefront.

Preferably, the phase change is a phase delay, having a value selectedfrom a plurality of pre-determined values, and the output indication ofthe phase change includes the value of the phase delay.

There is also provided in accordance with a preferred embodiment of thepresent invention a method of stored data retrieval. The method includesobtaining a stored data retrieval wavefront which has an amplitude and aphase, by reflecting radiation from the media in which information isencoded, by selecting the height of the media at each of a multiplicityof different locations on the media. Preferably, analyzing the storeddata retrieval wavefront by: obtaining a plurality of differently phasechanged transformed wavefronts corresponding to the stored dataretrieval wavefront, obtaining a plurality of intensity maps of theplurality of phase changed transformed wavefronts and employing theplurality of intensity maps to obtain an indication of the amplitude andphase of the stored data retrieval wavefront and employing theindication of the amplitude and phase to obtain the information.

There is further provided in accordance with yet another preferredembodiment of the present invention an apparatus for stored dataretrieval. The apparatus includes a wavefront obtainer operating toobtain a stored data retrieval wavefront which has an amplitude and aphase, by reflecting radiation from the media in which information isencoded by selecting the height of the media at each of a multiplicityof different locations on the media, a wavefront analyzer, analyzing thestored data retrieval wavefront and including a wavefront transformeroperating to provide a plurality of differently phase changedtransformed wavefronts corresponding to the stored data retrievalwavefront, an intensity map generator operating to obtain a plurality ofintensity maps of the plurality of phase changed transformed wavefrontsand an intensity map utilizer, employing the plurality of intensity mapsto provide an indication of the amplitude and phase of the stored dataretrieval wavefront and a phase and amplitude utilizer, employing theindication of the amplitude and phase to provide the information.

Preferably, the step of obtaining a plurality of differently phasechanged transformed wavefronts includes: applying a transform to thestored data retrieval wavefront thereby to obtain a transformedwavefront and applying a plurality of different phase changes to thetransformed wavefront, thereby to obtain a plurality of differentlyphase changed transformed wavefronts.

Further in accordance with a preferred embodiment of the presentinvention the transform applied to the stored data retrieval wavefrontis a Fourier transform, the plurality of different phase changesincludes at least three different phase changes, effected by applying aspatially uniform, time-varying spatial phase change to part of thetransformed wavefront, the plurality of intensity maps includes at leastthree intensity maps and employing the plurality of intensity maps toobtain an output indicating the amplitude and phase of the stored dataretrieval wavefront includes: expressing the stored data retrievalwavefront as a first complex function which has an amplitude and phaseidentical to the amplitude and phase of the stored data retrievalwavefront, expressing the plurality of intensity maps as a function ofthe first complex function and of a spatial function governing thespatially uniform, time-varying spatial phase change, defining a secondcomplex function having an absolute value and a phase as a convolutionof the first complex function and of a Fourier transform of the spatialfunction governing the spatially uniform, time-varying spatial phasechange, expressing each of the plurality of intensity maps as a thirdfunction of: the amplitude of the stored data retrieval wavefront, theabsolute value of the second complex function, a difference between thephase of the stored data retrieval wavefront and the phase of the secondcomplex function and a known phase delay produced by one of the at leastthree different phase changes, corresponding to one of the at leastthree intensity maps, solving the third function to obtain the amplitudeof the stored data retrieval wavefront, the absolute value of the secondcomplex function and the difference between the phase of the stored dataretrieval wavefront and the phase of the second complex function,solving the second complex function to obtain the phase of the secondcomplex function and obtaining the phase of the stored data retrievalwavefront by adding the phase of the second complex function to thedifference between the phase of the stored data retrieval wavefront andphase of the second complex function.

Still further in accordance with a preferred embodiment of the presentinvention the stored data retrieval wavefront includes at least oneone-dimensional component, the transform applied to the data retrievalwavefront is a one-dimensional Fourier transform, performed in adimension perpendicular to a direction of propagation of the dataretrieval wavefront, thereby to obtain at least one one-dimensionalcomponent of the transformed wavefront in the dimension perpendicular tothe direction of propagation, the plurality of differently phase changedtransformed wavefronts are obtained by applying the plurality ofdifferent phase changes to each of the one-dimensional component,thereby obtaining at least one one-dimensional component of theplurality of phase changed transformed wavefronts and the plurality ofintensity maps are employed to obtain an output indicating amplitude andphase of the one-dimensional component of the data retrieval wavefront.

Preferably, the plurality of different phase changes is applied to eachof the at least one one-dimensional component by providing a relativemovement between the media and a component generating spatially varying,time-constant phase changes, the relative movement being in a dimensionperpendicular to the direction of propagation and to the dimensionperpendicular to the direction of propagation.

Additionally in accordance with a preferred embodiment of the presentinvention the information is encoded on the media whereby: an intensityvalue is realized by reflection of light from each location on the mediato lie within a predetermined range of values, the range correspondingan element of the information stored at the location and by employingthe plurality of intensity maps, multiple intensity values are realizedfor each location, providing multiple elements of information for eachlocation on the media.

Preferably, the plurality of differently phase changed transformedwavefronts include a plurality of wavefronts whose phase has beenchanged by applying an at least time varying phase change function tothe stored data retrieval wavefront.

Further in accordance with a preferred embodiment of the presentinvention the stored data retrieval wavefront includes a plurality ofdifferent wavelength components and the plurality of differently phasechanged transformed wavefronts are obtained by applying at least onephase change to the plurality of different wavelength components of thestored data retrieval wavefront.

Further in accordance with a preferred embodiment of the presentinvention the radiation which is reflected from the media includes aplurality of different wavelength components, resulting in the storeddata retrieval wavefront including a plurality of different wavelengthcomponents and the plurality of differently phase changed transformedwavefronts are obtained by applying a phase change to the plurality ofdifferent wavelength components of the stored data retrieval wavefront.

Still further in accordance with a preferred embodiment of the presentinvention the information encoded by selecting the height of the mediaat each of a multiplicity of different locations on the media is alsoencoded by selecting the reflectivity of the media at each of aplurality of different locations on the media and employing theindication of the amplitude and phase to obtain the information includesemploying the indication of the phase to obtain the information encodedby selecting the height of the media and employing the indication of theamplitude to obtain the information encoded by selecting thereflectivity of the media.

There is provided in accordance with another preferred embodiment of thepresent invention a method of 3-dimensional imaging. The method includesobtaining a 3-dimensional imaging wavefront, which has an amplitude anda phase, by reflecting radiation from an object to be viewed andanalyzing the 3-dimensional imaging wavefront by: obtaining a pluralityof differently phase changed transformed wavefronts corresponding to the3-dimensional imaging wavefront, obtaining a plurality of intensity mapsof the plurality of differently phase changed transformed wavefronts andemploying the plurality of intensity maps to obtain an output indicatingthe amplitude and phase of the 3-dimensional imaging wavefront.

There is further provided in accordance with a preferred embodiment ofthe present invention an apparatus for 3-dimensional imaging. Theapparatus includes a wavefront obtainer operating to obtain a3-dimensional imaging wavefront, which has an amplitude and a phase, byreflecting radiation from an object to be viewed, a wavefront analyzer,analyzing the 3-dimensional imaging wavefront including a wavefronttransformer operative to provide a plurality of differently phasechanged transformed wavefronts corresponding to the 3-dimensionalimaging wavefront, an intensity map generator operative to provide aplurality of intensity maps of the plurality of differently phasechanged transformed wavefronts and an intensity map utilizer, employingthe plurality of intensity maps to provide an output indicating theamplitude and phase of the 3-dimensional imaging wavefront.

Further in accordance with a preferred embodiment of the presentinvention the radiation reflected from the object has a narrow bandabout a given wavelength, causing the phase of the 3-dimensional imagingwavefront to be proportional to geometrical variations in the object,the proportion being an inverse linear function of the wavelength.

Additionally in accordance with a preferred embodiment of the presentinvention the step of obtaining a plurality of differently phase changedtransformed wavefronts includes applying a transform to the3-dimensional imaging wavefront, thereby to obtain a transformedwavefront and applying a plurality of different phase changes, includingspatial phase changes, to the transformed wavefront, thereby to obtain aplurality of differently phase changed transformed wavefronts.

Still further in accordance with a preferred embodiment of the presentinvention the 3-dimensional imaging wavefront includes a plurality ofdifferent wavelength components and the plurality of differently phasechanged transformed wavefronts are obtained by: transforming the3-dimensional imaging wavefront, thereby obtaining a transformedwavefront including a plurality of different wavelength components andapplying phase changes to the plurality of different wavelengthcomponents of the transformed wavefront by passing the transformedwavefront through an object, at least one of whose thickness andrefractive index varies spatially.

There is also provided in accordance with yet another preferredembodiment of the present invention a method of wavefront analysis. Themethod includes obtaining a plurality of differently phase changedtransformed wavefronts corresponding to a wavefront being analyzed,obtaining a plurality of intensity maps of the plurality of phasechanged transformed wavefronts and employing the plurality of intensitymaps to obtain an output indicating at least the phase of the wavefrontbeing analyzed by combining the plurality of intensity maps into asecond plurality of combined intensity maps, the second plurality beingless than the first plurality, obtaining at least an output indicativeof the phase of the wavefront being analyzed from each of the secondplurality of combined intensity maps and combining the outputs toprovide at least an enhanced indication of phase of the wavefront beinganalyzed.

There is also provided in accordance with yet another preferredembodiment of the present invention an apparatus wavefront analysis. Theapparatus includes a wavefront transformer operating to provide aplurality of differently phase changed transformed wavefrontscorresponding to a wavefront being analyzed, an intensity map generatoroperating to obtain a plurality of intensity maps of the plurality ofphase changed transformed wavefronts and an intensity map utilizer,employing the plurality of intensity maps to obtain an output indicatingat least amplitude of the wavefront being analyzed and including anintensity combiner operating to combine the plurality of intensity mapsinto a second plurality of combined intensity maps, the second pluralitybeing less than the first plurality, an indication provider operating toprovide at least an output indicative of the amplitude of the wavefrontbeing analyzed from each of the second plurality of combined intensitymaps and an enhanced indication provider, combining the outputs toprovide at least an enhanced indication of amplitude of the wavefrontbeing analyzed.

There is provided in accordance with a further preferred embodiment ofthe present invention a method of wavefront analysis. The methodincludes obtaining a plurality of differently phase changed transformedwavefronts corresponding to a wavefront being analyzed, obtaining aplurality of intensity maps of the plurality of phase changedtransformed wavefront and employing the plurality of intensity maps toobtain an output indicating at least amplitude of the wavefront beinganalyzed by combining the plurality of intensity maps into a secondplurality of combined intensity maps, the second plurality being lessthan the first plurality, obtaining at least an output indicative of theamplitude of the wavefront being analyzed from each of the secondplurality of combined intensity maps and combining the outputs toprovide at least an enhanced indication of amplitude of the wavefrontbeing analyzed.

There is provided in accordance with a preferred embodiment of thepresent invention an apparatus for wavefront analysis. The apparatusincludes a wavefront transformer operating to provide a plurality ofdifferently phase changed transformed wavefronts corresponding to awavefront being analyzed, an intensity map generator operating toprovide a plurality of intensity maps of the plurality of phase changedtransformed wavefronts and an intensity map utilizer, employing theplurality of intensity maps to provide an output indicating at least thephase of the wavefront being analyzed. Preferably, the apparatus alsoincludes an intensity map expresser, expressing the plurality ofintensity maps as a function of: amplitude of the wavefront beinganalyzed, phase of the wavefront being analyzed and a phase changefunction characterizing the plurality of differently phase changedtransformed wavefronts, a complex function definer, defining a complexfunction of: the amplitude of the wavefront being analyzed, the phase ofthe wavefront being analyzed and the phase change functioncharacterizing the plurality of differently phase changed transformedwavefronts, the complex function being characterized in that theintensity at each location in the plurality of intensity maps is afunction predominantly of a value of the complex function at thelocation and of the amplitude and the phase of the wavefront beinganalyzed at the location. The apparatus also typically, includes complexfunction expresser, expressing the complex function as a function of theplurality of intensity maps and a phase obtainer, obtaining values forthe phase by employing the complex function expressed as a function ofthe plurality of intensity maps.

There is also provided in accordance with another preferred embodimentof the present invention a method of wavefront analysis. The methodincludes obtaining a plurality of differently phase changed transformedwavefronts corresponding to a wavefront being analyzed, obtaining aplurality of intensity maps of the plurality of phase changedtransformed wavefronts and employing the plurality of intensity maps toprovide an output indicating at least the phase of the wavefront beinganalyzed by: expressing the plurality of intensity maps as a functionof: amplitude of the wavefront being analyzed, phase of the wavefrontbeing analyzed and a phase change function characterizing the pluralityof differently phase changed transformed wavefronts. Additionally,defining a complex function of: the amplitude of the wavefront beinganalyzed, the phase of the wavefront being analyzed and the phase changefunction characterizing the plurality of differently phase changedtransformed wavefronts, the complex function being characterized in thatthe intensity at each location in the plurality of intensity maps is afunction predominantly of a value of the complex function at thelocation and of the amplitude and the phase of the wavefront beinganalyzed at the location, expressing the complex function as a functionof the plurality of intensity maps and obtaining values for the phase byemploying the complex function expressed as a function of the pluralityof intensity maps.

There is further provided in accordance with yet a further preferredembodiment of the present invention a method of wavefront analysis. Themethod includes applying a Fourier transform to a wavefront beinganalyzed which has an amplitude and a phase, thereby obtaining atransformed wavefront, applying a spatially uniform time-varying spatialphase change to part of the transformed wavefront, thereby to obtain atleast three differently phase changed transformed wavefronts, applying asecond Fourier transform to obtain at least three intensity maps of theat least three phase changed transformed wavefronts and employing the atleast three intensity maps to obtain an output indicating at least oneof the phase and the amplitude of the wavefront being analyzed by:expressing the wavefront being analyzed as a first complex functionwhich has an amplitude and phase identical to the amplitude and phase ofthe wavefront being analyzed, expressing the plurality of intensity mapsas a function of the first complex function and of a spatial functiongoverning the spatially uniform, time-varying spatial phase change,defining a second complex function having an absolute value and a phaseas a convolution of the first complex function and of a Fouriertransform of the spatial function governing the spatially uniform,time-varying spatial phase change, expressing each of the plurality ofintensity maps as a third function of: the amplitude of the wavefrontbeing analyzed, the absolute value of the second complex function, adifference between the phase of the wavefront being analyzed and thephase of the second complex function and a known phase delay produced byone of the at least three different phase changes, which each correspondto one of the at least three intensity maps, solving the third functionto obtain the amplitude of the wavefront being analyzed, the absolutevalue of the second complex function and the difference between thephase of the wavefront being analyzed and the phase of the secondcomplex function, solving the second complex function to obtain thephase of the second complex function and obtaining the phase of thewavefront being analyzed by adding the phase of the second complexfunction to the difference between the phase of the wavefront beinganalyzed and phase of the second complex function.

There is further provided in accordance with yet a further preferredembodiment of the present invention an apparatus for wavefront analysis.The apparatus includes a first transform applier, applying a Fouriertransform to a wavefront being analyzed which has an amplitude and aphase thereby to obtain a transformed wavefront, a phase change applier,applying a spatially uniform time-varying spatial phase change to partof the transformed wavefront, thereby obtaining at least threedifferently phase changed transformed wavefronts, a second transformapplier, applying a second Fourier transform to the at least threedifferently phase changed transformed wavefronts, thereby obtaining atleast three intensity maps. The apparatus also typically includes anintensity map utilizer, employing the at least three intensity maps toprovide an output indicating the phase and the amplitude of thewavefront being analyzed and a wavefront expresser, expressing thewavefront being analyzed as a first complex function which has anamplitude and phase identical to the amplitude and phase of thewavefront being analyzed, a first intensity map expresser, expressingthe plurality of intensity maps as a function of the first complexfunction and of a spatial function governing the spatially uniform,time-varying spatial phase change. Preferably, the apparatus alsoincludes a complex function definer, defining a second complex functionhaving an absolute value and a phase as a convolution of the firstcomplex function and of a Fourier transform of the spatial functiongoverning the spatially uniform, time-varying spatial phase change, asecond intensity map expresser, expressing each of the plurality ofintensity maps as a third function of: the amplitude of the wavefrontbeing analyzed, the absolute value of the second complex function, adifference between the phase of the wavefront being analyzed and thephase of the second complex function and a known phase delay produced byone of the at least three different phase changes, which each correspondto one of the at least three intensity maps. The apparatus furthertypically includes a first function solver, solving the third functionto obtain the amplitude of the wavefront being analyzed, the absolutevalue of the second complex function and the difference between thephase of the wavefront being analyzed and the phase of the secondcomplex function, a second function solver, solving the second complexfunction to obtain the phase of the second complex function and a phaseobtainer, obtaining the phase of the wavefront being analyzed by addingthe phase of the second complex function to the difference between thephase of the wavefront being analyzed and the phase of the secondcomplex function.

BRIEF DESCRIPTION OF THE DRAWINGS

The present invention will be understood and appreciated more fully fromthe following detailed description, taken in conjunction with thedrawings in which:

FIG. 1A is a simplified partially schematic, partially pictorialillustration of wavefront analysis functionality operative in accordancewith a preferred embodiment of the present invention;

FIG. 1B is a simplified partially schematic, partially block diagramillustration of a wavefront analysis system suitable for carrying outthe functionality of FIG. 1A in accordance with a preferred embodimentof the present invention;

FIG. 2 is a simplified functional block diagram illustration of thefunctionality of FIG. 1A where time-varying phase changes are applied toa transformed wavefront;

FIG. 3 is a simplified functional block diagram illustration of thefunctionality of FIG. 1A where time-varying phase changes are applied toa wavefront prior to transforming thereof;

FIG. 4 is a simplified functional block diagram illustration of thefunctionality of FIG. 2 where time-varying, non-spatially varyingspatial phase changes are applied to a transformed wavefront;

FIG. 5 is a simplified functional block diagram illustration of thefunctionality of FIG. 3 where time-varying, non-spatially varyingspatial phase changes are applied to a wavefront prior to transformingthereof;

FIG. 6 is a simplified functional block diagram illustration of thefunctionality of FIG. 1A where phase changes are applied to a pluralityof different wavelength components of a transformed wavefront;

FIG. 7 is a simplified functional block diagram illustration of thefunctionality of FIG. 1A where phase changes are applied to a pluralityof different wavelength components of a wavefront prior to transformingthereof;

FIG. 8 is a simplified functional block diagram illustration of thefunctionality of FIG. 1A where phase changes are applied to a pluralityof different polarization components of a transformed wavefront;

FIG. 9 is a simplified functional block diagram illustration of thefunctionality of FIG. 1A where phase changes are applied to a pluralityof different polarization components of a wavefront prior totransforming thereof;

FIG. 10A is a simplified functional block diagram illustration of thefunctionality of FIG. 1A where a wavefront being analyzed comprises atleast one one-dimensional component;

FIG. 10B is a simplified partially schematic, partially pictorialillustration of a wavefront analysis system suitable for carrying outthe functionality of FIG. 10A in accordance with a preferred embodimentof the present invention;

FIG. 11 is a simplified functional block diagram illustration of thefunctionality of FIG. 1A where an additional transform is appliedfollowing the application of spatial phase changes;

FIG. 12 is a simplified functional block diagram illustration of thefunctionality of FIG. 1A, wherein intensity maps are employed to provideinformation about a wavefront being analyzed, such as indications ofamplitude and phase of the wavefront;

FIG. 13 is a simplified functional block diagram illustration of part ofthe functionality of FIG. 1A, wherein the transform applied to thewavefront being analyzed is a Fourier transform, wherein at least threedifferent spatial phase changes are applied to a transformed wavefront,and wherein at least three intensity maps are employed to obtainindications of at least the phase of a wavefront;

FIG. 14 is a simplified partially schematic, partially pictorialillustration of part of one preferred embodiment of a wavefront analysissystem of the type shown in FIG. 1B;

FIG. 15 is a simplified partially schematic, partially pictorialillustration of a system for surface mapping employing the functionalityand structure of FIGS. 1A and 1B;

FIG. 16 is a simplified partially schematic, partially pictorialillustration of a system for object inspection employing thefunctionality and structure of FIGS. 1A and 1B;

FIG. 17 is a simplified partially schematic, partially pictorialillustration of a system for spectral analysis employing thefunctionality and structure of FIGS. 1A and 1B;

FIG. 18 is a simplified partially schematic, partially pictorialillustration of a system for phase-change analysis employing thefunctionality and structure of FIGS. 1A and 1B;

FIG. 19 is a simplified partially schematic, partially pictorialillustration of a system for stored data retrieval employing thefunctionality and structure of FIGS. 1A and 1B;

FIG. 20 is a simplified partially schematic, partially pictorialillustration of a system for 3-dimensional imaging employing thefunctionality and structure of FIGS. 1A and 1B;

FIG. 21A is a simplified partially schematic, partially pictorialillustration of wavefront analysis functionality operative in accordancewith another preferred embodiment of the present invention;

FIG. 21B is a simplified partially schematic, partially block diagramillustration of a wavefront analysis system suitable for carrying outthe functionality of FIG. 21A in accordance with another preferredembodiment of the present invention; and

FIG. 22 is a simplified partially schematic, partially pictorialillustration of a system for surface mapping employing the functionalityand structure of FIGS. 21A and 21B.

DETAILED DESCRIPTION OF PREFERRED EMBODIMENTS

Reference is now made to FIG. 1A, which is a simplified partiallyschematic, partially pictorial illustration of wavefront analysisfunctionality operative in accordance with a preferred embodiment of thepresent invention. The functionality of FIG. 1A can be summarized asincluding the following sub-functionalities:

-   A. obtaining a plurality of differently phase changed transformed    wavefronts corresponding to a wavefront being analyzed, which has an    amplitude and a phase;-   B. obtaining a plurality of intensity maps of the plurality of phase    changed transformed wavefronts; and-   C. employing the plurality of intensity maps to obtain an output    indicating at least one and possibly both of the phase and the    amplitude of the wavefront being analyzed.

As seen in FIG. 1A, the first sub-functionality, designated “A” may berealized by the following functionalities:

A wavefront, which may be represented by a plurality of point sources oflight, is generally designated by reference numeral 100. Wavefront 100has a phase characteristic which is typically spatially non-uniform,shown as a solid line and indicated generally by reference numeral 102.Wavefront 100 also has an amplitude characteristic which is alsotypically spatially non-uniform, shown as a dashed line and indicatedgenerally by reference numeral 103. Such a wavefront may be obtained ina conventional manner by receiving light from any object, such as byreading an optical disk, for example a DVD or compact disk 104.

A principal purpose of the present invention is to measure the phasecharacteristic, such as that indicated by reference numeral 102, whichis not readily measured. Another purpose of the present invention is tomeasure the amplitude characteristic, such as that indicated byreference numeral 103 in an enhanced manner. A further purpose of thepresent invention is to measure both the phase characteristic 102 andthe amplitude characteristic 103. While there exist various techniquesfor carrying out such measurements, the present invention provides amethodology which is believed to be superior to those presently known,inter alia due to its relative insensitivity to noise.

A transform, indicated here symbolically by reference numeral 106, isapplied to the wavefront being analyzed 100, thereby to obtain atransformed wavefront. A preferred transform is a Fourier transform. Theresulting transformed wavefront is symbolically indicated by referencenumeral 108.

A plurality of different phase changes, preferably spatial phasechanges, represented by optical path delays 110, 112 and 114 are appliedto the transformed wavefront 108, thereby to obtain a plurality ofdifferently phase changed transformed wavefronts, represented byreference numerals 120, 122 and 124 respectively. It is appreciated thatthe illustrated difference between the individual ones of the pluralityof differently phase changed transformed wavefronts is that portions ofthe transformed wavefront are delayed differently relative to theremainder thereof. The difference in the phase changes, which areapplied to the transformed wavefront 108, is represented in FIG. 1A bythe change in thickness of the optical path delays 110, 112 and 114.

As seen in FIG. 1A, the second sub-functionality, designated “B”, may berealized by applying a transform, preferably a Fourier transform, to theplurality of differently phase changed transformed wavefronts.Alternatively, the sub-functionality B may be realized without the useof a Fourier transform, such as by propagation of the differently phasechanged transformed wavefronts over an extended space. Finally,functionality B requires detection of the intensity characteristics ofplurality of differently phase changed transformed wavefronts. Theoutputs of such detection are the intensity maps, examples of which aredesignated by reference numerals 130, 132 and 134.

As seen in FIG. 1A, the third sub-functionality, designated “C” may berealized by the following functionalities:

-   -   expressing, such as by employing a computer 136, the plurality        of intensity maps, such as maps 130, 132 and 134, as at least        one mathematical function of phase and amplitude of the        wavefront being analyzed and of the plurality of different phase        changes, wherein at least one and possibly both of the phase and        the amplitude are unknown and the plurality of different phase        changes, typically represented by optical path delays 110, 112        and 114 to the transformed wavefront 108, are known; and    -   employing, such as by means of the computer 136, the at least        one mathematical function to obtain an indication of at least        one and possibly both of the phase and the amplitude of the        wavefront being analyzed, here represented by the phase function        designated by reference numeral 138 and the amplitude function        designated by reference numeral 139, which, as can be seen,        respectively represent the phase characteristics 102 and the        amplitude characteristics 103 of the wavefront 100. In this        example, wavefront 100 may represent the information contained        in the compact disk or DVD 104.

In accordance with an embodiment of the present invention, the pluralityof intensity maps comprises at least four intensity maps. In such acase, employing the plurality of intensity maps to obtain an outputindicating at least the phase of the wavefront being analyzed includesemploying a plurality of combinations, each of at least three of theplurality of intensity maps, to provide a plurality of indications atleast of the phase of the wavefront being analyzed.

Preferably, the methodology also includes employing the plurality ofindications of at least the phase of the wavefront being analyzed toprovide an enhanced indication at least of the phase of the wavefrontbeing analyzed.

Also in accordance with an embodiment of the present invention, theplurality of intensity maps comprises at least four intensity maps. Insuch a case, employing the plurality of intensity maps to obtain anoutput indicating at least the amplitude of the wavefront being analyzedincludes employing a plurality of combinations, each of at least threeof the plurality of intensity maps, to provide a plurality ofindications at least of the amplitude of the wavefront being analyzed.

Preferably, the methodology also includes employing the plurality ofindications of at least the amplitude of the wavefront being analyzed toprovide an enhanced indication at least of the amplitude of thewavefront being analyzed.

It is appreciated that in this manner, enhanced indications of bothphase and amplitude of the wavefront may be obtained.

In accordance with a preferred embodiment of the present invention, atleast some of the plurality of indications of the amplitude and phaseare at least second order indications of the amplitude and phase of thewavefront being analyzed.

In accordance with one preferred embodiment of the present invention,the plurality of intensity maps are employed to provide an analyticaloutput indicating the amplitude and phase.

Preferably, the phase changed transformed wavefronts are obtained byinterference of the wavefront being analyzed along a common opticalpath.

In accordance with one preferred embodiment of the present invention,the plurality of differently phase changed transformed wavefronts arerealized in a manner substantially different from performing adelta-function phase change to the transformed wavefront, whereby adelta-function phase change is applying a uniform phase delay to a smallspatial region, having the characteristics of a delta-function, of thetransformed wavefront.

In accordance with another preferred embodiment of the presentinvention, the plurality of intensity maps are employed to obtain anoutput indicating the phase of the wavefront being analyzed, which issubstantially free from halo and shading off distortions, which arecharacteristic of many of the existing ‘phase-contrast’ methods.

In accordance with another embodiment of the present invention theoutput indicating the phase of the wavefront being analyzed may beprocessed to obtain the polarization mode of the wavefront beinganalyzed.

In accordance with still another embodiment of the present invention,the plurality of intensity maps may be employed to obtain an outputindicating the phase of the wavefront being analyzed by combining theplurality of intensity maps into a second plurality of combinedintensity maps, the second plurality being less than the firstplurality, obtaining at least an output indicative of the phase of thewavefront being analyzed from each of the second plurality of combinedintensity maps and combining the outputs to provide an enhancedindication of the phase of the wavefront being analyzed.

In accordance with yet another embodiment of the present invention, theplurality of intensity maps may be employed to obtain an outputindicating amplitude of the wavefront being analyzed by combining theplurality of intensity maps into a second plurality of combinedintensity maps, the second plurality being less than the firstplurality, obtaining at least an output indicative of the amplitude ofthe wavefront being analyzed from each of the second plurality ofcombined intensity maps and combining the outputs to provide an enhancedindication of the amplitude of the wavefront being analyzed.

Additionally in accordance with a preferred embodiment of the presentinvention, the foregoing methodology may be employed for obtaining aplurality of differently phase changed transformed wavefrontscorresponding to a wavefront being analyzed, obtaining a plurality ofintensity maps of the plurality of phase changed transformed wavefrontsand employing the plurality of intensity maps to obtain an output of anat least second order indication of phase of the wavefront beinganalyzed.

Additionally or alternatively in accordance with a preferred embodimentof the present invention, the foregoing methodology may be employed forobtaining a plurality of differently phase changed transformedwavefronts corresponding to a wavefront being analyzed, obtaining aplurality of intensity maps of the plurality of phase changedtransformed wavefronts and employing the plurality of intensity maps toobtain an output of an at least second order indication of amplitude ofthe wavefront being analyzed.

In accordance with yet another embodiment of the present invention, theobtaining of the plurality of differently phase changed transformedwavefronts comprises applying a transform to the wavefront beinganalyzed, thereby to obtain a transformed wavefront, and then applying aplurality of different phase and amplitude changes to the transformedwavefront, where each of these changes can be a phase change, anamplitude change or a combined phase and amplitude change, thereby toobtain a plurality of differently phase and amplitude changedtransformed wavefronts.

In accordance with yet another embodiment of the present invention, awavefront being analyzed comprises at least two wavelength components.In such a case, obtaining a plurality of intensity maps also includesdividing the phase changed transformed wavefronts according to the atleast two wavelength components in order to obtain at least twowavelength components of the phase changed transformed wavefronts and inorder to obtain at least two sets of intensity maps, each setcorresponding to a different one of the at least two wavelengthcomponents of the phase changed transformed wavefronts.

Subsequently, the plurality of intensity maps are employed to provide anoutput indicating the amplitude and phase of the wavefront beinganalyzed by obtaining an output indicative of the phase of the wavefrontbeing analyzed from each of the at least two sets of intensity maps andcombining the outputs to provide an enhanced indication of phase of thewavefront being analyzed. In the enhanced indication, there is no 2πambiguity once the value of the phase exceeds 2π, which conventionallyresults when detecting a phase of a single wavelength wavefront.

It is appreciated that the wavefront being analyzed may be an acousticradiation wavefront.

It is also appreciated that the wavefront being analyzed may be anelectromagnetic radiation wavefront, of any suitable wavelength, such asvisible light, infrared, ultra-violet and X-ray radiation.

It is further appreciated that wavefront 100 may be represented by arelatively small number of point sources and defined over a relativelysmall spatial region. In such a case, the detection of the intensitycharacteristics of the plurality of differently phase changedtransformed wavefronts may be performed by a detector comprising only asingle detection pixel or several detection pixels. Additionally, theoutput indicating at least one and possibly both of the phase andamplitude of the wavefront being analyzed, may be provided by computer136 in a straight-forward manner.

Reference is now made to FIG. 1B, which is a simplified partiallyschematic, partially block diagram illustration of a wavefront analysissystem suitable for carrying out the functionality of FIG. 1A inaccordance with a preferred embodiment of the present invention. As seenin FIG. 1B, a wavefront, here designated by reference numeral 150 isfocused, as by a lens 152, onto a phase manipulator 154, which ispreferably located at the focal plane of lens 152. The phase manipulator154 generates phase changes, and may be, for example, a spatial lightmodulator or a series of different transparent, spatially non-uniformobjects.

A second lens 156 is arranged so as to image wavefront 150 onto adetector 158, such as a CCD detector. Preferably the second lens 156 isarranged such that the detector 158 lies in its focal plane. The outputof detector 158 is preferably supplied to data storage and processingcircuitry 160, which preferably carries out functionality “C” describedhereinabove with reference to FIG. 1A.

Reference is now made to FIG. 2, which is a simplified functional blockdiagram illustration of the functionality of FIG. 1A where time-varyingphase changes are applied to a transformed wavefront. As seen in FIG. 2,and as explained hereinabove with reference to FIG. 1A, a wavefront 200is preferably transformed to provide a transformed wavefront 208.

A first phase change, preferably a spatial phase change, is applied tothe transformed wavefront 208 at a first time T1, as indicated byreference numeral 210, thereby producing a phase changed transformedwavefront 212 at time T1. This phase changed transformed wavefront 212is detected, as by detector 158 (FIG. 1B), producing an intensity map,an example of which is designated by reference numeral 214, which map isstored as by circuitry 160 (FIG. 1B).

Thereafter, a second phase change, preferably a spatial phase change, isapplied to the transformed wavefront 208 at a second time T2, asindicated by reference numeral 220, thereby producing a phase changedtransformed wavefront 222 at time T2. This phase changed transformedwavefront 222 is detected, as by detector 158 (FIG. 1B), producing anintensity map, an example of which is designated by reference numeral224, which map is stored as by circuitry 160 (FIG. 1B).

Thereafter, a third phase change, preferably a spatial phase change, isapplied to the transformed wavefront 208 at a third time T3, asindicated by reference numeral 230, thereby producing a phase changedtransformed wavefront 232 at time T3. This phase changed transformedwavefront 232 is detected, as by detector 158 (FIG. 1B), producing anintensity map, an example of which is designated by reference numeral234, which map is stored as by circuitry 160 (FIG. 1B).

It is appreciated that any suitable number of spatial phase changes maybe made at successive times and stored for use in accordance with thepresent invention.

In accordance with a preferred embodiment of the present invention, atleast some of the phase changes 210, 220 and 230, are spatial phasechanges effected by applying a spatial phase change to part of thetransformed wavefront 208.

In accordance with another preferred embodiment of the presentinvention, at least some of the phase changes 210, 220 and 230, arespatial phase changes, effected by applying a time-varying spatial phasechange to part of the transformed wavefront 208.

In accordance with another preferred embodiment of the presentinvention, at least some of the phase changes 210, 220 and 230, arespatial phase changes, effected by applying a non time-varying spatialphase change to part of transformed wavefront 208, producing spatiallyphase changed transformed wavefronts 212, 222 and 232, whichsubsequently produce spatially varying intensity maps 214, 224 and 234respectively.

Reference is now made to FIG. 3, which is a simplified functional blockdiagram illustration of the functionality of FIG. 1A where time-varyingphase changes are applied to a wavefront prior to transforming thereof.As seen in FIG. 3, a first phase change, preferably a spatial phasechange, is applied to a wavefront 300 at a first time T1, as indicatedby reference numeral 310. Following application of the first phasechange to wavefront 300, a transform, preferably a Fourier transform, isapplied thereto, thereby producing a phase changed transformed wavefront312 at time T1. This phase changed transformed wavefront 312 isdetected, as by detector 158 (FIG. 1B), producing an intensity map, anexample of which is designated by reference numeral 314, which map isstored as by circuitry 160 (FIG. 1B).

Thereafter, a second phase change, preferably a spatial phase change, isapplied to wavefront 300 at a second time T2, as indicated by referencenumeral 320. Following application of the second phase change towavefront 300, a transform, preferably a Fourier transform, is appliedthereto, thereby producing a phase changed transformed wavefront 322 attime T2. This phase changed transformed wavefront 322 is detected, as bydetector 158 (FIG. 1B), producing an intensity map, an example of whichis designated by reference numeral 324, which map is stored as bycircuitry 160 (FIG. 1B).

Thereafter, a third phase change, preferably a spatial phase change, isapplied to wavefront 300 at a third time T3, as indicated by referencenumeral 330. Following application of the third phase change towavefront 300, a transform, preferably a Fourier transform, is appliedthereto, thereby producing a phase changed transformed wavefront 332 attime T3. This phase changed transformed wavefront 332 is detected, as bydetector 158 (FIG. 1B), producing an intensity map, an example of whichis designated by reference numeral 334, which map is stored as bycircuitry 160 (FIG. 1B).

It is appreciated that any suitable number of spatial phase changes maybe made at successive times and stored for use in accordance with thepresent invention.

In accordance with a preferred embodiment of the present invention, atleast some of the phase changes 310, 320 and 330, are spatial phasechanges effected by applying a spatial phase change to part of wavefront300.

In accordance with another preferred embodiment of the presentinvention, at least some of the phase changes 310, 320 and 330, arespatial phase changes, effected by applying a time-varying spatial phasechange to part of wavefront 300.

In accordance with another preferred embodiment of the presentinvention, at least some of the phase changes 310, 320 and 330, arespatial phase changes, effected by applying a non time-varying spatialphase change to part of wavefront 300, producing spatially phase changedtransformed wavefronts 312, 322 and 332, which subsequently producespatially varying intensity maps 314, 324 and 334 respectively.

Reference is now made to FIG. 4, which is a simplified functional blockdiagram illustration of the functionality of FIG. 2, specifically in acase where time-varying, non-spatially varying, spatial phase changesare applied to a transformed wavefront. As seen in FIG. 4, and asexplained hereinabove with reference to FIG. 1A, a wavefront 400 ispreferably transformed to provide a transformed wavefront 408. Apreferred transform is a Fourier transform.

A first spatial phase change is applied to the transformed wavefront 408at a first time T1, as indicated by reference numeral 410. This phasechange preferably is effected by applying a spatially uniform spatialphase delay D, designated by reference ‘D=D1’, to a given spatial regionof the transformed wavefront 408. Thus, at the given spatial region ofthe transformed wavefront, the value of the phase delay at time T1 isD1, while at the remainder of the transformed wavefront, where no phasedelay is applied, the value of the phase delay is D=0.

The first spatial phase change 410 thereby produces a spatially phasechanged transformed wavefront 412 at time T1. This spatially phasechanged transformed wavefront 412 is detected, as by detector 158 (FIG.1B), producing a spatially varying intensity map, an example of which isdesignated by reference numeral 414, which map is stored as by circuitry160 (FIG. 1B).

Thereafter, a second spatial phase change is applied to the transformedwavefront 408 at a second time T2, as indicated by reference numeral420. This phase change preferably is effected by applying a spatiallyuniform spatial phase delay D, designated by reference ‘D=D2’, to agiven spatial region of the transformed wavefront 408. Thus, at thegiven spatial region of the transformed wavefront, the value of thephase delay at time T2 is D2, while at the remainder of the transformedwavefront, where no phase delay is applied, the value of the phase delayis D=0.

The second spatial phase change 420 thereby produces a spatially phasechanged transformed wavefront 422 at time T2. This spatially phasechanged transformed wavefront 422 is detected, as by detector 158 (FIG.1B), producing a spatially varying intensity map, an example of which isdesignated by reference numeral 424, which map is stored as by circuitry160 (FIG. 1B).

Thereafter, a third spatial phase change is applied to the transformedwavefront 408 at a third time T3, as indicated by reference numeral 430.This phase change preferably is effected by applying a spatially uniformspatial phase delay D, designated by reference ‘D=D3’, to a givenspatial region of the transformed wavefront 408. Thus, at the givenspatial region of the transformed wavefront, the value of the phasedelay at time T3 is D3, while at the remainder of the transformedwavefront, where no phase delay is applied, the value of the phase delayis D=0.

The third spatial phase change 430 thereby produces a spatially phasechanged transformed wavefront 432 at time T3. This spatially phasechanged transformed wavefront 432 is detected, as by detector 158 (FIG.1B), producing a spatially varying intensity map, an example of which isdesignated by reference numeral 434, which map is stored as by circuitry160 (FIG. 1B).

It is appreciated that any suitable number of spatial phase changes maybe made at successive times and stored for use in accordance with thepresent invention.

In accordance with a preferred embodiment of the present invention, thetransform applied to the wavefront 400 is a Fourier transform, therebyproviding a Fourier-transformed wavefront 408. In addition, theplurality of phase changed transformed wavefronts 412, 422 and 432 maybe further transformed, preferably by a Fourier transform, prior todetection thereof.

In accordance with a preferred embodiment of the present invention, thespatial region of the transformed wavefront 408 to which the spatiallyuniform, spatial phase delays D1, D2 and D3 are applied at times T1, T2and T3 respectively is a spatially central region of the transformedwavefront 408.

In accordance with an embodiment of the present invention, a phasecomponent comprising relatively high frequency components may be addedto the wavefront 400 prior to applying the transform thereto, in orderto increase the high-frequency content of the transformed wavefront 408prior to applying the spatially uniform, spatial phase delays to aspatial region thereof.

Additionally, in accordance with a preferred embodiment of the presentinvention, the spatial region of the transformed wavefront 408 to whichthe spatially uniform, spatial phase delays D1, D2 and D3 are applied attimes T1, T2 and T3 respectively is a spatially central region of thetransformed wavefront 408, the transform applied to the wavefront 400 isa Fourier transform, and the plurality of phase changed transformedwavefronts 412, 422 and 432 are Fourier transformed prior to detectionthereof.

In accordance with another embodiment of the present invention, theregion of the transformed wavefront 408 to which the spatially uniform,spatial phase delays D1, D2 and D3 are applied at times T1, T2 and T3respectively is a spatially centered generally circular region of thetransformed wavefront 408.

In accordance with yet another embodiment of the present invention, theregion of the transformed wavefront 408 to which the spatially uniform,spatial phase delays D1, D2 and D3 are applied at times T1, T2 and T3respectively is a region covering approximately one half of the entireregion in which transformed wavefront 408 is defined.

In accordance with a preferred embodiment of the present invention, thetransformed wavefront 408 includes a non-spatially modulated region,termed a DC region, which represents an image of a light sourcegenerating the wavefront 400, and a non-DC region. The region of thetransformed wavefront 408 to which the spatially uniform, spatial phasedelays D1, D2 and D3 are applied at times T1, T2 and T3 respectivelyincludes at least parts of both the DC region and the non-DC region.

Reference is now made to FIG. 5, which is a simplified functional blockdiagram illustration of the functionality of FIG. 3, where time-varying,non-spatially varying, spatial phase changes are applied to a wavefrontprior to transforming thereof.

As seen in FIG. 5, a first spatial phase change is applied to awavefront 500 at a first time T1, as indicated by reference numeral 510.This phase change preferably is effected by applying a spatially uniformspatial phase delay D, designated by reference ‘D=D1’, to a givenspatial region of the wavefront 500. Thus, at the given spatial regionof the wavefront, the value of the phase delay at time T1 is D1, whileat the remainder of the wavefront, where no phase delay is applied, thevalue of the phase delay is D=0.

Following application of the first spatial phase change to wavefront500, a transform, preferably a Fourier transform, is applied thereto,thereby producing a spatially phase changed transformed wavefront 512 attime T1. This spatially phase changed transformed wavefront 512 isdetected, as by detector 158 (FIG. 1B), producing a spatially varyingintensity map, an example of which is designated by reference numeral514, which map is stored as by circuitry 160 (FIG. 1B).

Thereafter, a second spatial phase change is applied to wavefront 500 ata second time T2, as indicated by reference numeral 520. This phasechange preferably is effected by applying a spatially uniform spatialphase delay D, designated by reference ‘D=D2’, to a given spatial regionof the wavefront 500. Thus, at the given spatial region of thewavefront, the value of the phase delay at time T2 is D2, while at theremainder of the wavefront, where no phase delay is applied, the valueof the phase delay is D=0.

Following application of the second spatial phase change to wavefront500, a transform, preferably a Fourier transform, is applied thereto,thereby producing a spatially phase changed transformed wavefront 522 attime T2. This spatially phase changed transformed wavefront 522 isdetected, as by detector 158 (FIG. 1B), producing a spatially varyingintensity map, an example of which is designated by reference numeral524, which map is stored as by circuitry 160 (FIG. 1B).

Thereafter, a third spatial phase change is applied to wavefront 500 ata third time T3, as indicated by reference numeral 530. This phasechange preferably is effected by applying a spatially uniform spatialphase delay D, designated by reference ‘D=D3’, to a given spatial regionof the wavefront 500. Thus, at the given spatial region of thewavefront, the value of the phase delay at time T3 is D3, while at theremainder of the wavefront, where no phase delay is applied, the valueof the phase delay is D=0.

Following application of the third spatial phase change to wavefront500, a transform, preferably a Fourier transform, is applied thereto,thereby producing a spatially phase changed transformed wavefront 532 attime T3. This spatially phase changed transformed wavefront 532 isdetected, as by detector 158 (FIG. 1B), producing a spatially varyingintensity map, an example of which is designated by reference numeral534, which map is stored as by circuitry 160 (FIG. 1B).

It is appreciated that any suitable number of spatial phase changes maybe made at successive times and stored for use in accordance with thepresent invention.

In accordance with a preferred embodiment of the present invention, thespatial region of the wavefront 500 to which the spatially uniform,spatial phase delays D1, D2 and D3 are applied at times T1, T2 and T3respectively is a spatially central region of the wavefront 500.

In accordance with an embodiment of the present invention, a phasecomponent comprising relatively high frequency components may be addedto the wavefront 500 prior to applying the spatial phase changesthereto, in order to increase the high-frequency content of thewavefront 500.

Additionally, in accordance with a preferred embodiment of the presentinvention, the spatial region of the wavefront 500 to which thespatially uniform, spatial phase delays D1, D2 and D3 are applied attimes T1, T2 and T3 respectively is a spatially central region of thewavefront 500, the transforms are Fourier transforms, and the pluralityof phase changed transformed wavefronts 512, 522 and 532 are Fouriertransformed prior to detection thereof.

In accordance with another embodiment of the present invention, theregion of the wavefront 500 to which the spatially uniform, spatialphase delays D1, D2 and D3 are applied at times T1, T2 and T3respectively is a spatially centered generally circular region of thewavefront 500.

In accordance with yet another embodiment of the present invention, theregion of the wavefront 500 to which the spatially uniform, spatialphase delays D1, D2 and D3 are applied at times T1, T2 and T3respectively is a region covering approximately one half of the entireregion in which wavefront 500 is defined.

In accordance with a preferred embodiment of the present invention, thewavefront 500 includes a non-spatially modulated region, termed a DCregion, which represents an image of a light source generating thewavefront 500, and a non-DC region. The region of the wavefront 500 towhich the spatially uniform, spatial phase delays D1, D2 and D3 areapplied at times T1, T2 and T3 respectively includes at least parts ofboth the DC region and the non-DC region.

Reference is now made to FIG. 6, which is a simplified functional blockdiagram illustration of the functionality of FIG. 1A where phase changesare applied to a plurality of different wavelength components of atransformed wavefront. As seen in FIG. 6, a wavefront 600, whichcomprises a plurality of different wavelength components, is preferablytransformed to obtain a transformed wavefront 602. The transform ispreferably a Fourier transform.

Similarly to wavefront 600, the transformed wavefront 602 also includesa plurality of different wavelength components, represented by referencenumerals 604, 606 and 608. It is appreciated that both the wavefront 600and the transformed wavefront 602 can include any suitable number ofwavelength components.

A plurality of phase changes, preferably spatial phase changes,represented by reference numerals 610, 612 and 614 are applied torespective wavelength components 604, 606 and 608 of the transformedwavefront, thereby providing a plurality of differently phase changedtransformed wavefront components, represented by reference numerals 620,622 and 624 respectively.

The phase changed transformed wavefront components 620, 622, and 624 maybe transformed, preferably by a Fourier transform, and are subsequentlydetected, as by detector 158 (FIG. 1B), producing spatially varyingintensity maps, examples of which are designated by reference numerals630, 632 and 634 respectively. These intensity maps are subsequentlystored as by circuitry 160 (FIG. 1B).

In accordance with an embodiment of the present invention, phase changes610, 612 and 614 are effected by passing the transformed wavefront 602through an object, at least one of whose thickness and refractive indexvaries spatially, thereby applying a different spatial phase delay toeach of the wavelength components 604, 606 and 608 of the transformedwavefront.

In accordance with another embodiment of the present invention, thephase changes 610, 612 and 614 are effected by reflecting thetransformed wavefront 602 from a spatially varying surface, therebyapplying a different spatial phase delay to each of the wavelengthcomponents 604, 606 and 608 of the transformed wavefront.

In accordance with yet another embodiment of the present invention, thephase changes 610, 612 and 614 are realized by passing the transformedwavefront 602 through a plurality of objects, each characterized in thatat least one of its thickness and refractive index varies spatially. Thespatial variance of the thickness or of the refractive index of theplurality of objects is selected in a way such that the phase changes610, 612 and 614 differ to a selected predetermined extent for at leastsome of the plurality of different wavelength components 604, 606 and608.

Alternatively, the spatial variance of the thickness or refractive indexof the plurality of objects is selected in a way such that the phasechanges 610, 612 and 614 are identical for at least some of theplurality of different wavelength components 604, 606 and 608.

Additionally, in accordance with an embodiment of the present invention,the phase changes 610, 612 and 614 are time-varying spatial phasechanges. In such a case, the plurality of phase changed transformedwavefront components 620, 622 and 624 include a plurality of differentlyphase changed transformed wavefronts for each wavelength componentthereof, and the intensity maps 630, 632 and 634 include a time-varyingintensity map for each such wavelength component.

In accordance with an embodiment of the present invention, termed a“white light” embodiment, all the wavelength components may be detectedby a single detector, resulting in a time-varying intensity maprepresenting several wavelength components.

In accordance with another embodiment of the present invention, theplurality of phase changed transformed wavefront components 620, 622 and624 are broken down into separate wavelength components, such as by aspatial separation effected, for example, by passing the phase changedtransformed wavefront components through a dispersion element. In such acase, the intensity maps 630, 632 and 634 are provided simultaneouslyfor all of the plurality of different wavelength components.

Reference is now made to FIG. 7, which is a simplified functional blockdiagram illustration of the functionality of FIG. 1A where phase changesare applied to a plurality of different wavelength components of awavefront, prior to transforming thereof As seen in FIG. 7, a wavefront700 comprises a plurality of different wavelength components 704, 706and 708. It is appreciated that the wavefront can include any suitablenumber of wavelength components.

A plurality of phase changes, preferably spatial phase changes,represented by reference numerals 710, 712 and 714, are applied to therespective wavelength components 704, 706 and 708 of the wavefront.

Following application of the spatial phase changes to wavefrontcomponents 704, 706 and 708, a transform, preferably a Fouriertransform, is applied thereto, thereby providing a plurality ofdifferent phase changed transformed wavefront components, represented byreference numerals 720, 722 and 724 respectively.

These phase changed transformed wavefront components 720, 722 and 724are subsequently detected, as by detector 158 (FIG. 1B), producingspatially varying intensity maps, examples of which are designated byreference numerals 730, 732 and 734. These intensity maps aresubsequently stored as by circuitry 160 (FIG. 1B).

In accordance with an embodiment of the present invention, phase changes710, 712 and 714 are effected by passing the wavefront 700 through anobject, at least one of whose thickness and refractive index variesspatially, thereby applying a different spatial phase delay to each ofthe wavelength components 704, 706 and 708 of the wavefront.

In accordance with another embodiment of the present invention, thephase changes 710, 712 and 714 are effected by reflecting the wavefront700 from a spatially varying surface, thereby applying a differentspatial phase delay to each of the wavelength components 704, 706 and708 of the wavefront.

In accordance with yet another embodiment of the present invention phasechanges 710, 712 and 714 are realized by passing the wavefront 700through a plurality of objects, each characterized in that at least oneof its thickness and refractive index varies spatially. The spatialvariance of the thickness or refractive index of these objects isselected in a way such that the phase changes 710, 712 and 714 differ toa selected predetermined extent for at least some of the plurality ofdifferent wavelength components 704, 706 and 708.

Alternatively, the spatial variance of the thickness or refractive indexof these objects is selected in a way that the phase changes 710, 712and 714 are identical for at least some of the plurality of differentwavelength components 704, 706 and 708.

Reference is now made to FIG. 8, which is a simplified functional blockdiagram illustration of the functionality of FIG. 1A where phase changesare applied to a plurality of different polarization components of atransformed wavefront. As seen in FIG. 8, a wavefront 800, whichcomprises a plurality of different polarization components, ispreferably transformed to obtain a transformed wavefront 802. Thetransform is preferably a Fourier transform. Similarly to wavefront 800,the transformed wavefront 802 also includes a plurality of differentpolarization components, represented by reference numerals 804 and 806.It is appreciated that the polarization components 804 and 806 can beeither spatially different or spatially identical, but are each ofdifferent polarization. It is further appreciated that both thewavefront 800 and the transformed wavefront 802 preferably each includetwo polarization components but can include any suitable number ofpolarization components.

A plurality of phase changes, preferably spatial phase changes,represented by reference numerals 810 and 812, are applied to therespective polarization components 804 and 806 of the transformedwavefront 802, thereby providing a plurality of differently phasechanged transformed wavefront components, represented by referencenumerals 820 and 822 respectively.

It is appreciated that phase changes 810 and 812 can be different for atleast some of the plurality of different polarization components 804 and806. Alternatively, phase changes 810 and 812 can be identical for atleast some of the plurality of different polarization components 804 and806.

The phase changed transformed wavefront components 820 and 822 aredetected, as by detector 158 (FIG. 1B), producing spatially varyingintensity maps, examples of which are designated by reference numerals830 and 832. These intensity maps are subsequently stored as bycircuitry 160 (FIG. 1B).

Reference is now made to FIG. 9, which is a simplified functional blockdiagram illustration of the functionality of FIG. 1A where phase changesare applied to a plurality of different polarization components of awavefront prior to transforming thereof. As seen in FIG. 9, a wavefront900 comprises a plurality of different polarization components 904 and906. It is appreciated that the wavefront preferably includes twopolarization components but can include any suitable number ofpolarization components.

A plurality of phase changes, preferably spatial phase changes,represented by reference numerals 910 and 912, are applied to therespective polarization components 904 and 906 of the wavefront.

It is appreciated that phase changes 910 and 912 can be different for atleast some of the plurality of different polarization components 904 and906. Alternatively, phase changes 910 and 912 can be set to be identicalfor at least some of the plurality of different polarization components904 and 906.

Following application of the spatial phase changes to wavefrontcomponents 904 and 906, a transform, preferably a Fourier transform, isapplied thereto, thereby providing a plurality of different phasechanged transformed wavefront components, designated by referencenumerals 920 and 922 respectively.

Phase changed transformed wavefront components 920 and 922 aresubsequently detected, as by detector 158 (FIG. 1B), producing spatiallyvarying intensity maps, examples of which are designated by referencenumeral 930 and 932. These intensity maps are subsequently stored as bycircuitry 160 (FIG. 1B).

Reference is now made to FIG. 10A, which is a simplified functionalblock diagram illustration of the functionality of FIG. 1A, where awavefront being analyzed comprises at least one one-dimensionalcomponent. In the embodiment of FIG. 10A, a one-dimensional Fouriertransform is applied to the wavefront. Preferably, the transform isperformed in a dimension perpendicular to a direction of propagation ofthe wavefront being analyzed, thereby to obtain at least oneone-dimensional component of the transformed wavefront in the dimensionperpendicular to the direction of propagation.

A plurality of different phase changes are applied to each of the atleast one one-dimensional components, thereby obtaining at least oneone-dimensional component of the plurality of phase changed transformedwavefronts.

A plurality of intensity maps are employed to obtain an outputindicating amplitude and phase of the at least one one-dimensionalcomponent of the wavefront being analyzed.

As seen in FIG. 10A, a plurality of different phase changes are appliedto at least one one-dimensional component of a transformed wavefront. Inthe illustrated embodiment, typically five one-dimensional components ofa wavefront are shown and designated by reference numerals 1001, 1002,1003, 1004 and 1005. The wavefront is transformed, preferably by aFourier transform. It is thus appreciated that due to transform of thewavefront, the five one-dimensional components 1001, 1002, 1003, 1004and 1005 are transformed into five corresponding one-dimensionalcomponents of the transformed wavefront, respectively designated byreference numerals 1006, 1007, 1008, 1009 and 1010.

Three phase changes, respectively designated 1011, 1012 & 1013 are eachapplied to the one-dimensional components 1006, 1007, 1008, 1009 and1010 of transformed wavefront to produce three phase changed transformedwavefronts, designated generally by reference numerals 1016, 1018 and1020.

In the illustrated embodiment, phase changed transformed wavefront 1016includes five one-dimensional components, respectively designated byreference numerals 1021, 1022, 1023, 1024 and 1025.

In the illustrated embodiment, phase changed transformed wavefront 1018includes five one-dimensional components, respectively designated byreference numerals 1031, 1032, 1033, 1034 and 1035.

In the illustrated embodiment, phase changed transformed wavefront 1020includes five one-dimensional components, respectively designated byreference numerals 1041, 1042, 1043, 1044 and 1045.

The phase changed transformed wavefronts 1016, 1018 and 1020 aredetected, as by detector 158 (FIG. 1B), producing three intensity maps,designated generally by reference numerals 1046, 1048 and 1050.

In the illustrated embodiment, intensity map 1046 includes fiveone-dimensional intensity map components, respectively designated byreference numerals 1051, 1052, 1053, 1054 and 1055.

In the illustrated embodiment, intensity map 1048 includes fiveone-dimensional intensity map components, respectively designated byreference numerals 1061, 1062, 1063, 1064 and 1065.

In the illustrated embodiment, intensity map 1050 includes fiveone-dimensional intensity map components, respectively designated byreference numerals 1071, 1072, 1073, 1074 and 1075.

The intensity maps 1046, 1048 and 1050 are stored as by circuitry 160(FIG. 1B).

In accordance with an embodiment of the present invention, the wavefrontbeing analyzed, illustrated in FIG. 10A by the one-dimensionalcomponents 1001, 1002, 1003, 1004 and 1005, may comprise a plurality ofdifferent wavelength components and the plurality of different phasechanges, 1011, 1012 and 1013, are applied to the plurality of differentwavelength components of each of the plurality of one-dimensionalcomponents of the wavefront being analyzed. Preferably, obtaining aplurality of intensity maps 1046, 1048 and 1050, includes dividing theplurality of one-dimensional components of the plurality of phasechanged transformed wavefronts 1016, 1018 and 1020 into separatewavelength components.

Preferably, dividing the plurality of one-dimensional components of theplurality of phase changed transformed wavefronts into separatewavelength components is achieved by passing the plurality of phasechanged transformed wavefronts 1016, 1018 and 1020 through a dispersionelement.

Reference is now made to FIG. 10B, which is a simplified partiallyschematic, partially pictorial illustration of a wavefront analysissystem suitable for carrying out the functionality of FIG. 10A inaccordance with a preferred embodiment of the present invention.

As seen in FIG. 10B, a wavefront, here designated by reference numeral1080, and here including five one-dimensional components 1081, 1082,1083, 1084 and 1085 is focused, as by a cylindrical lens 1086 onto asingle axis displaceable phase manipulator 1087, which is preferablylocated at the focal plane of lens 1086. Lens 1086 preferably produces aone-dimensional Fourier transform of each of the one-dimensionalwavefront components 1081, 1082, 1083, 1084 and 1085 along the Y-axis.

As seen in FIG. 10B, the phase manipulator 1087 preferably comprises amultiple local phase delay element, such as a spatially non-uniformtransparent object, typically including five different phase delayregions, each arranged to apply a phase delay to one of theone-dimensional components at a given position of the object along anaxis, here designated as the X-axis, extending perpendicularly to thedirection of propagation of the wavefront along a Z-axis andperpendicular to the axis of the transform produced by lens 1086, heredesignated as the Y-axis.

A second lens 1088, preferably a cylindrical lens, is arranged so as toimage the one-dimensional components 1081, 1082, 1083, 1084 and 1085onto a detector 1089, such as a CCD detector. Preferably the second lens1088 is arranged such that the detector 1089 lies in its focal plane.The output of detector 1089 is preferably supplied to data storage andprocessing circuitry 1090, which preferably carries out functionality“C” described hereinabove with reference to FIG. 1A.

There is provided relative movement between the optical systemcomprising phase manipulator 1087, lenses 1086 and 1088 and detector1089 and the one-dimensional wavefront components 1081, 1082, 1083, 1084and 1085 along the X-axis. This relative movement sequentially matchesdifferent phase delay regions with different wavefront components, suchthat preferably each wavefront component passes through each phase delayregion of the phase manipulator 1087.

It is a particular feature of the embodiment of FIGS. 10A and 10B, thateach of the one dimensional components of the wavefront is separatelyprocessed. Thus, in the context of FIG. 10B, it can be seen that thefive one-dimensional wavefront components 1081, 1082, 1083, 1084 and1085 are each focused by a separate portion of the cylindrical lens1086, are each imaged by a corresponding separate portion of thecylindrical lens 1088 and each pass through a distinct region of thephase manipulator 1087. The images of each of the five one-dimensionalwavefront components 1081, 1082, 1083, 1084 and 1085 at detector 1089are thus seen to be separate and distinct images, as designatedrespectively by reference numerals 1091, 1092, 1093, 1094 and 1095. Itis appreciated that these images may appear on separate detectorstogether constituting detector 1089 instead of on a monolithic detector.

In accordance with an embodiment of the present invention, the transformapplied to the wavefront includes an additional Fourier transform. Thisadditional Fourier transform may be performed by lens 1086 or by anadditional lens and is operative to minimize cross-talk betweendifferent one-dimensional components of the wavefront. In such a case,preferably a further transform is applied to the phase changedtransformed wavefront. This further transform may be performed by lens1088 or by an additional lens.

Reference is now made to FIG. 11, which is a simplified functional blockdiagram illustration of the functionality of FIG. 1A, where anadditional transform is applied following the application of spatialphase changes. As seen in FIG. 11, and as explained hereinabove withreference to FIG. 1A, a wavefront 1100 is transformed, preferably by aFourier transform and a plurality of phase changes are applied to thetransformed wavefront, thereby to provide a plurality of differentlyphased changed transformed wavefronts, represented by reference numerals1120, 1122, and 1124.

The phase changed transformed wavefronts are subsequently transformed,preferably by a Fourier transform, and then detected, as by detector 158(FIG. 1B), producing spatially varying intensity maps, examples of whichare designated by reference numerals 1130, 1132 and 1134. Theseintensity maps are subsequently stored as by circuitry 160 (FIG. 1B).

It is appreciated that any suitable number of differently phased changedtransformed wavefronts can be obtained, and subsequently transformed toa corresponding plurality of intensity maps to be stored for use inaccordance with the present invention.

Reference in now made to FIG. 12, which is a simplified functional blockdiagram illustration of the functionality of FIG. 1A, wherein intensitymaps are employed to provide information about a wavefront beinganalyzed, such as indications of amplitude and phase of the wavefront.As seen in FIG. 12, and as explained hereinabove with reference to FIG.1A, a wavefront 1200 is transformed, preferably by a Fourier transform,and phase changed by a phase-change function to obtain several,preferably at least three, differently phase-changed transformedwavefronts, respectively designated by reference numerals 1210, 1212 and1214. The phase changed transformed wavefronts 1210, 1212 and 1214 aresubsequently detected, as by detector 158 (FIG. 1B), producing spatiallyvarying intensity maps, examples of which are designated by referencenumerals 1220, 1222 and 1224.

In parallel to producing the plurality of intensity maps, such asintensity maps 1220, 1222 and 1224, the expected intensity maps areexpressed as a first function of the amplitude of wavefront 1200, of thephase of wavefront 1200, and of the phase change function characterizingthe differently phase changed transformed wavefronts 1210, 1212 and1214, as indicated at reference numeral 1230.

In accordance with a preferred embodiment of the present invention, atleast one of the phase and the amplitude of the wavefront is unknown orboth the phase and the amplitude are unknown. The phase-change functionis known.

The first function of the phase and amplitude of the wavefront and ofthe phase change function is subsequently solved as indicated atreference numeral 1235, such as by means of a computer 136 (FIG. 1A),resulting in an expression of at least one and possibly both of theamplitude and phase of wavefront 1200 as a second function of theintensity maps 1220, 1222 and 1224, as indicated at reference numeral1240.

The second function is then processed together with the intensity maps1220, 1222 and 1224 as indicated at reference numeral 1242. As part ofthis processing, detected intensity maps 1220, 1222 and 1224 aresubstituted into the second function. The processing may be carried outby means of a computer 136 (FIG. 1A) and provides information regardingwavefront 1200, such as indications of at least one and possibly both ofthe amplitude and the phase of the wavefront.

In accordance with a further embodiment of the present invention, theplurality of intensity maps comprises at least four intensity maps. Insuch a case, employing the plurality of intensity maps to obtain anindication of at least one of the phase and the amplitude of thewavefront 1200 includes employing a plurality of combinations, each ofthe combinations being a combination of at least three of the pluralityof intensity maps, to provide a plurality of indications of at least oneof the phase and the amplitude of wavefront 1200. Preferably, thismethodology also includes employing the plurality of indications of atleast one of the phase and the amplitude of the wavefront 1200 toprovide an enhanced indication at least one of the phase and theamplitude of the wavefront 1200.

In accordance with a preferred embodiment of the present invention, atleast some of the plurality of indications of the amplitude and phaseare at least second order indications of the amplitude and phase of thewavefront 1200.

In accordance with another embodiment of the present invention, thefirst function may be solved as a function of some unknowns to obtainthe second function by expressing, as indicated by reference numeral1240, some unknowns, such as at least one of the amplitude and phase ofwavefront 1200, as a second function of the intensity maps.

Accordingly, solving the first function may include:

-   -   defining a complex function of the amplitude of wavefront 1200,        of the phase of wavefront 1200, and of the phase change function        characterizing the differently phase changed transformed        wavefronts 1210, 1212 and 1214. This complex function is        characterized in that intensity at each location in the        plurality of intensity maps is a function predominantly of a        value of the complex function at that location and of the        amplitude and the phase of wavefront 1200 at the same location;    -   expressing the complex function as a third function of the        plurality of intensity maps 1220, 1222 and 1224; and    -   obtaining values for the unknowns, such as at least one of phase        and amplitude of wavefront 1200, by employing the complex        function expressed as a function of the plurality of intensity        maps.

In accordance with this embodiment, preferably the complex function is aconvolution of another complex function, which has an amplitude andphase identical to the amplitude and phase of wavefront 1200, and of aFourier transform of the phase change function characterizing thedifferently phase changed transformed wavefronts 1210, 1212 and 1214.

Reference in now made to FIG. 13, which is a simplified functional blockdiagram illustration of part of the functionality of FIG. 1A, whereinthe transform applied to the wavefront being analyzed is a Fouriertransform, wherein at least three different spatial phase changes areapplied to the thus transformed wavefront, and wherein at least threeintensity maps are employed to obtain indications of at least one of thephase and the amplitude of the wavefront.

As explained hereinabove with reference to FIG. 1A, a wavefront 100(FIG. 1A) being analyzed, is transformed and phase changed by at leastthree different spatial phase changes, all governed by a spatialfunction, to obtain at least three differently phase-changed transformedwavefronts, represented by reference numerals 120, 122 and 124 (FIG. 1A)which are subsequently detected, as by detector 158 (FIG. 1B), producingspatially varying intensity maps, examples of which are designated byreference numerals 130, 132 and 134 (FIG. 1A). As seen in FIG. 13, anddesignated as sub-functionality “C” hereinabove with reference in FIG.1A, the intensity maps are employed to obtain an output indication of atleast one and possibly both of the phase and the amplitude of thewavefront being analyzed.

Turning to FIG. 13, it is seen that the wavefront being analyzed isexpressed as a first complex function ƒ(x)=A(x)_(e) ^(iφ(x)), where ‘x’is a general indication of a spatial location. The complex function hasan amplitude distribution A(x) and a phase distribution φ(x) identicalto the amplitude and phase of the wavefront being analyzed. The firstcomplex function ƒ(x)=A(x)_(e) ^(iφ(x)) is indicated by referencenumeral 1300.

As noted hereinabove with reference to FIG. 1A, each of the plurality ofdifferent spatial phase changes is applied to the transformed wavefrontpreferably by applying a spatially uniform spatial phase delay having aknown value to a given spatial region of the transformed wavefront. Asseen in FIG. 13, the spatial function governing these different phasechanges is designated by ‘G’ and an example of which, for a phase delayvalue of θ, is designated by reference numeral 1304.

Function ‘G’ is a spatial function of the phase change applied in eachspatial location of the transformed wavefront. In the specific exampledesignated by reference numeral 1304, the spatially uniform spatialphase delay, having a value of θ, is applied to a spatially centralregion of the transformed wavefront, as indicated by the central part ofthe function having a value of θ, which is greater than the value of thefunction elsewhere.

A plurality of expected intensity maps, indicated by spatial functionsI₁(x), I₂(x) and I₃(x), are each expressed as a function of the firstcomplex function ƒ(x) and of the spatial function G, as indicated byreference numeral 1308.

Subsequently, a second complex function S(x), which has an absolutevalue |S(x)| and a phase α(x), is defined as a convolution of the firstcomplex function ƒ(x) and of a Fourier transform of the spatial function‘G’. This second complex function, designated by reference numeral 1312,is indicated by the equation S(x)=ƒ(x)*ℑ(G)=|S(x)|_(e) ^(iα(x)), wherethe symbol ‘*’ indicates convolution and ℑ(G) is the Fourier transformof the function ‘G’.

The difference between φ(x), the phase of the wavefront, and α(x), thephase of the second complex function, is indicated by ψ(x), asdesignated by reference numeral 1316.

The expression of each of the expected intensity maps as a function ofƒ(x) and G, as indicated by reference numeral 1308, the definition ofthe absolute value and the phase of S(x), as indicated by referencenumeral 1312 and the definition of ψ(x), as indicated by referencenumeral 1316, enables expression of each of the expected intensity mapsas a third function of the amplitude of the wavefront A(x), the absolutevalue of the second complex function |S(x)|, the difference between thephase of the wavefront and the phase of the second complex functionψ(x), and the known phase delay produced by one of the at least threedifferent phase changes which each correspond to one of the at leastthree intensity maps.

This third function is designated by reference numeral 1320 and includesthree functions, each preferably having the general form

I_(n)(x) = |A(x) + (𝕖^(𝕚 θ_(n)) − 1)|S(x)|𝕖^(−𝕚ψ(x))|²where I_(n)(x) are the expected intensity maps and n=1,2 or 3. In thethree functions, θ₁, θ₂ and θ₃ are the known values of the uniformspatial phase delays, each applied to a spatial region of thetransformed wavefront, thus effecting the plurality of different spatialphase changes which produce the intensity maps I₁(x), I₂(x) and I₃(x),respectively.

It is appreciated that preferably the third function at any givenspatial location x₀ is a function of A, ψ and |S| only at the samespatial location x₀.

The intensity maps are designated by reference numeral 1324.

The third function is solved for each of the specific spatial locationsx₀, by solving at least three equations, relating to at least threeintensity values I₁(x₀), I₂(x₀) and I₃(x₀) at at least three differentphase delays θ₁, θ₂ and θ₃, thereby to obtain at least part of threeunknowns A(x₀), |S(x₀)| and ψ(x₀). This process is typically repeatedfor all spatial locations and results in obtaining the amplitude of thewavefront A(x), the absolute value of the second complex function |S(x)|and the difference between the phase of the wavefront and the phase ofthe second complex function ψ(x), as indicated by reference numeral1328.

Thereafter, once A(x), |S(x)| and ψ(x) are known, the equation definingthe second complex function, represented by reference numeral 1312, istypically solved globally for a substantial number of spatial locations‘x’ to obtain a(x), the phase of the second complex function, asdesignated by reference numeral 1332.

Finally, the phase φ(x) of the wavefront being analyzed is obtained byadding the phase α(x) of the second complex function to the differenceψ(x) between the phase of the wavefront and the phase of the secondcomplex function, as indicated by reference numeral 1336.

In accordance with an embodiment of the present invention, the absolutevalue |S| of the second complex function is obtained preferably forevery specific spatial location x₀ by approximating the absolute valueto a polynomial of a given degree in the spatial location x.

In accordance with another preferred embodiment of the presentinvention, the phase α(x) of the second complex function is obtained byexpressing the second complex function S(x) as an eigen-value problem,such as S=S·M where M is a matrix, and the complex function is aneigen-vector of the matrix obtained by an iterative process. An exampleof such an iterative process is S₀=|S|, S_(n+1)=S_(n)M/∥S_(n)M∥, where nis the iterative step number.

In accordance with yet another preferred embodiment of the presentinvention, the phase α(x) of the second complex function is obtained byapproximating the Fourier transform of the spatial function ‘G’,governing the spatial phase change, to a polynomial in the location x,by approximating the second complex function S(x) to a polynomial in thelocation x, and by solving, according to these approximations, theequation defining the second complex function:

${{S(x)} = {\left( {\frac{{A(x)}{\mathbb{e}}^{{\mathbb{i}\psi}{(x)}}}{\left| {S(x)} \right|}{S(x)}} \right)*{{??}\lbrack G\rbrack}}},$where the function

$\frac{{A(x)}{\mathbb{e}}^{{\mathbb{i}\psi}{(x)}}}{\left| {S(x)} \right|}$is known.

In accordance with still another preferred embodiment of the presentinvention, at any location x the amplitude A(x) of the wavefront beinganalyzed, the absolute value |S(x)| of the second complex function, andthe difference ψ(x) between the phase of the second complex function andthe phase of the wavefront are obtained by a best-fit method, such as aleast-square method, preferably a linear least-square method, from thevalues of the intensity maps at this location I_(n)(x), where n=1,2, . .. ,N and N is the number of intensity maps. The accuracy of this processincreases as the number N of the plurality of intensity maps increases.

In accordance with one preferred embodiment of the present invention,the plurality of different phase changes comprises at least fourdifferent phase changes, the plurality of intensity maps comprises atleast four intensity maps, and the function designated by referencenumeral 1320 can express each of the expected intensity maps as a thirdfunction of:

-   -   the amplitude of the wavefront A(x),    -   the absolute value of the second complex function |S(x)|;    -   the difference between the phase of the wavefront and the phase        of the second complex function ψ(x);    -   the known phase delay produced by one of the at least four        different phase changes each of which corresponds to one of the        at least four intensity maps; and    -   at least one additional unknown relating to the wavefront        analysis, where the number of the at least one additional        unknown is no greater than the number by which the plurality        intensity maps exceeds three.

The third function 1320, is then solved by solving at least fourequations, resulting from at least four intensity values at at leastfour different phase delays, thereby to obtain the amplitude of thewavefront being analyzed, the absolute value of the second complexfunction, the difference between the phase of the wavefront and thephase of the second complex function and the at least one additionalunknown.

In accordance with another preferred embodiment of the presentinvention, the values of the uniform spatial phase delays θ₁, θ₂, . . ., θ_(N) applied to a spatial region of the transformed wavefront, thuseffecting the plurality of different spatial phase changes, producingthe intensity maps I₁(x), I₂(x), . . . , I_(N)(x) respectively, arechosen as to maximize contrast in the intensity maps and to minimizeeffects of noise on the phase of the wavefront being analyzed.

In accordance with one more preferred embodiment of the presentinvention, the function designated by reference numeral 1320, expressingeach of the expected intensity maps as a third function of the amplitudeof the wavefront A(x), the absolute value of the second complex function|S(x)|, the difference between the phase of the wavefront and the phaseof the second complex function ψ(x), and the known phase delay θ_(i)produced by one of the at least three different phase changes which eachcorrespond to one of the at least three intensity maps, comprisesseveral functionalities:

-   -   defining fourth, fifth and sixth complex functions, designated        as β₀(x), β_(s)(x) and β_(c)(x) respectively, none of which is a        function of any of the plurality of intensity maps or of the        spatial function ‘G’ governing the phase change. Each of the        fourth, fifth and sixth complex functions is preferably a        function of the amplitude of the wavefront A(x), the absolute        value of the second complex function |S(x)|, the difference        between the phase of the wavefront and the phase of the second        complex function ψ(x); and    -   expressing each of the plurality of intensity maps I_(n)(x) as        I_(n)(x)=β₀(x)+β_(C)(x)cos(θ_(n))+β_(S)(x)sin(θ_(n)), where        θ_(n) is the value of the phase delay corresponding to intensity        map I_(n)(x). Each intensity map I_(n)(x), where n=1,2, . . . N,        preferably expressed as

I_(n)(x) = |A(x) + (𝕖^(𝕚 θ_(n)) − 1)|S(x)|𝕖^(−𝕚ψ(x))|²,can be subsequently expressed asI_(n)(x)=β₀(x)+β_(C)(x)cos(θ_(n))+β_(S)(x)sin(θ_(n)), where

$\quad\left\{ \begin{matrix}{{\beta_{0}(x)} = \left. {{A(x)}^{2} + 2} \middle| {S(x)} \middle| {}_{2}{{- 2}{A(x)}} \middle| {S(x)} \middle| {\cos(\psi)} \right.} \\{{\beta_{C}(x)} = \left. {2{A(x)}} \middle| {S(x)} \middle| {{\cos(\psi)} - 2} \middle| {S(x)} \right|^{2}} \\{{\beta_{S}(x)} = \left. {2{A(x)}} \middle| {S(x)} \middle| {\sin(\psi)} \right.}\end{matrix} \right.$

Preferably the foregoing methodology also includes solving the thirdfunction 1320 by using a linear least-square method to compute from thedifferent intensities I(θ₁), . . . ,I(θ_(N)), the values of β₀, β_(c)and β_(s) best fitting to I(θ_(n))=β₀+β_(c) cos θ_(n)+β_(s) sin θ_(n).Subsequently the amplitude A(x) is found by

${{A(x)} = \sqrt{{\beta_{0}(x)} + {\beta_{c}(x)}}},$the absolute value |S(x)| of the second complex function is found bysolving the second degree equation

${{{S(x)}}^{4} - {{\beta_{0}(x)}{{S(x)}}^{2}} + \frac{{\beta_{C}(x)}^{2} + {\beta_{S}(x)}^{2}}{4}} = 0$for |S(x)|², and ψ(x) is found by ψ(x)=arg(β_(C)(x)+2|S(x)|²+iβ_(S)(x))

In accordance with yet another preferred embodiment of the presentinvention, solving of the third function, designated by referencenumeral 1320, to obtain, as designated by reference numeral 1328, theamplitude of the wavefront A(x), the absolute value of the secondcomplex function |S(x)| and the difference between the phase of thewavefront and the phase of the second complex function ψ(x), includesseveral functionalities:

-   -   obtaining two solutions for the absolute value |S(x)| of the        second complex function, these two solutions, being designated        by |S_(h)(x)| and |S_(l)(x)|, namely a higher value solution and        a lower value solution respectively; and    -   combining the two solutions into an enhanced absolute value        solution |S(x)| for the absolute value of the second complex        function, by choosing at each spatial location ‘x₀’ either the        higher value solution |S_(h)(x₀)| or the lower value solution        |S_(l)(x₀)| such that the enhanced absolute value solution        satisfies the second complex function, designated by reference        numeral 1312.

Preferably the methodology also includes:

-   -   obtaining two solutions for each of the amplitude A(x) of the        wavefront being analyzed and the difference ψ(x) between the        phase of the wavefront and the phase of the second complex        function, these two solutions being higher value solutions        A_(h)(x) and ψ_(h)(x) and lower value solutions A_(l)(x) and        ψ_(l)(x); and    -   combining the two solutions A_(h)(x) and A_(l)(x) for the        amplitude into an enhanced amplitude solution A(x) by choosing        at each spatial location ‘x₀’ either the higher value solution        A_(h)(x₀) or the lower value solution A_(l)(x₀) in a way that at        each spatial location ‘x₀’ if |S_(h)(x₀)| is chosen for the        absolute value solution, then A_(h)(x₀) is chosen for the        amplitude solution and at each location ‘x₁’ if |S_(l)(x₁)| is        chosen for the absolute value solution, then A_(l)(x₁) is chosen        for the amplitude solution; and    -   combining the two solutions ψ_(h)(X) and ψ_(l)(x) of the        difference between the phase of the wavefront and the phase of        the second complex function into an enhanced difference solution        ψ(x), by choosing at each spatial location ‘x₀’ either the        higher value solution ψ_(h)(x₀) or the lower value solution        ψ_(l)(x₀) in a way that at each spatial location ‘x₀’ if        |S_(h)(x₀)| is chosen for the absolute value solution, then        ψ_(h)(x₀) is chosen for the difference solution and at each        location ‘x₁’ if |S_(l)(x₁)| is chosen for the absolute value        solution, then ψ_(l)(x₁) is chosen for the difference solution.

Additionally, in accordance with an embodiment of the present invention,the plurality of different phase changes applied to the transformedwavefront, thereby to obtain a plurality of differently phase changedtransformed wavefronts, also include amplitude changes, resulting in aplurality of differently phase and amplitude changed transformedwavefronts. These amplitude changes are preferably known amplitudeattenuations applied to the same spatial region of the transformedwavefront to which the uniform phase delays θ₁, θ₂, . . . , θ_(N), areapplied, the spatial region being defined by the spatial function ‘G’.

The amplitude attenuations are designated by σ₁, σ₂, . . . , σ_(N),where the n-th change, where n=1,2, . . . N, applied to the transformedwavefront includes a phase change θ_(n) and an amplitude attenuationσ_(n). It is appreciated that some of the phase changes may be equal tozero, indicating no phase-change and that some of the amplitudeattenuations may be equal to unity, indicating no amplitude attenuation.

In this embodiment, the function designated by reference numeral 1320,expressing each of the expected intensity maps I_(n)(x) as a thirdfunction of the amplitude of the wavefront A(x), the absolute value ofthe second complex function |S(x)|, the difference between the phase ofthe wavefront and the phase of the second complex function ψ(x), and thephase delay θ_(n), also expresses each of the expected intensity mapsalso as a function of the amplitude attenuation σ_(n) and comprisesseveral functionalities:

-   -   defining fourth, fifth, sixth and seventh complex functions,        designated by β₀(x), β₁(x), β₂(x) and β₃(x) respectively, none        of which is a function of any of the plurality of intensity maps        or of the spatial function ‘G’ governing the phase and amplitude        changes. Each of the fourth, fifth, sixth and seventh complex        functions is preferably a function of the amplitude of the        wavefront A(x), the absolute value of the second complex        function |S(x)|, the difference between the phase of the        wavefront and the phase of the second complex function ψ(x);    -   defining an eighth function, designated μ, as a combination of        the phase delay and of the amplitude attenuation, where for the        n-th change applied to the transformed wavefront, including a        phase change θ_(n) and an amplitude attenuation σ_(n), this        eighth function is designated by μ_(n). Preferably the        combination μ_(n) is defined by μ_(n)=σ_(n)e^(iθ) ^(n) −1; and    -   expressing each of the plurality of intensity maps I_(n)(x) as

${{I_{n}(x)} = {{\beta_{0}(x)} + {{\beta_{1}(x)}{\mu_{n}}^{2}} + {{\beta_{2}(x)}\mu_{n}} + \mspace{14mu}{{\beta_{3}(x)}{\overset{\_}{\mu}}_{n}}}},{{{{where}\mspace{14mu}{\beta_{0}(x)}} = {A^{2}(x)}};{{\beta_{1}(x)} = {{S(x)}}^{2}};{{\beta_{2}(x)} = {{{A(x)}{{S(x)}}{\mathbb{e}}^{- {{\mathbb{i}\psi}{(x)}}}\mspace{14mu}{and}\mspace{14mu}{\beta_{3}(x)}} = {{A(x)}{{S(x)}}{{\mathbb{e}}^{{\mathbb{i}\psi}{(x)}}.}}}}}$

Preferably the foregoing methodology also includes solving the thirdfunction 1320 by computing from the different intensities I_(n)(x), thevalues of β₀(x), β₁(x), β₂(x) and β₃(x) best fitting to the equationI_(n)(x)=β₀(x)+β₁(x)|μ_(n)|²+β₂(x)μ_(n)+β₃(x) μ _(n). Subsequently theamplitude A(x) is found by

${{A(x)} = \sqrt{\beta_{0}(x)}},$the absolute value |S(x)| of the second complex function is found by

${{S(x)}} = \sqrt{\beta_{1}(x)}$and ψ(x) is found by solving e^(iψ(x))=angle(β₃(x)).

It is appreciated that the amplitude attenuations σ₁, σ₂, . . . , σ_(N),may be unknown. In such a case, additional intensity maps are obtained,where the number of the unknowns is no greater than the number by whichthe plurality of intensity maps exceeds three. The unknowns are obtainedin a manner similar to that described hereinabove, where there exists atleast one unknown relating to the wavefront analysis.

Reference is now made to FIG. 14, which is a simplified partiallyschematic, partially pictorial illustration of part of one preferredembodiment of a wavefront analysis system of the type shown in FIG. 1B.As seen in FIG. 14, a wavefront, here designated by reference numeral1400 is partially transmitted through a beam splitter 1402 andsubsequently focused, as by a lens 1404 onto a phase manipulator 1406,which is preferably located at the focal plane of lens 1404. The phasemanipulator 1406 may be, for example, a spatial light modulator or aseries of different transparent, spatially non-uniform objects.

A reflecting surface 1408 is arranged so as to reflect wavefront 1400after it passes through the phase manipulator 1406. The reflectedwavefront is imaged by lens 1404 onto a detector 1410, such as a CCDdetector via beam splitter 1402. Preferably the beam splitter 1402 andthe detector 1410 are arranged such that the detector 1410 lies in thefocal plane of lens 1404. The output of detector 1410 is preferablysupplied to data storage and processing circuitry 1412, which preferablycarries out functionality “C” described hereinabove with reference toFIG. 1A.

It is appreciated that adding the reflecting surface 1408 to an imagingsystem, doubles the phase delay generated by phase manipulator 1406,enables imaging with a single lens 1404, and generally enablesrealization of a more compact system.

Reference is now made to FIG. 15, which is a simplified partiallyschematic, partially pictorial illustration of a system for surfacemapping employing the functionality and structure of FIGS. 1A and 1B. Asseen in FIG. 15, a beam of radiation, such as light or acoustic energy,is supplied from a radiation source 1500, optionally via a beam expander1502, onto a beam splitter 1504, which reflects at least part of theradiation onto a surface 1506 to be inspected. The radiation reflectedfrom the inspected surface 1506, is a surface mapping wavefront, whichhas an amplitude and a phase, and which contains information about thesurface 1506. At least part of the radiation incident on surface 1506 isreflected from the surface 1506 and transmitted via the beam splitter1504 and focused via a focusing lens 1508 onto a phase manipulator 1510,which is preferably located at the image plane of radiation source 1500.

The phase manipulator 1510 may be, for example, a spatial lightmodulator or a series of different transparent, spatially non-uniformobjects. It is appreciated that phase manipulator 1510 can be configuredsuch that a substantial part of the radiation focused thereonto isreflected therefrom. Alternatively the phase manipulator 1510 can beconfigured such that a substantial part of the radiation focusedthereonto is transmitted therethrough.

A second lens 1512 is arranged so as to image surface 1506 onto adetector 1514, such as a CCD detector. Preferably the second lens 1512is arranged such that the detector 1514 lies in its focal plane. Theoutput of detector 1514, an example of which is a set of intensity mapsdesignated by reference numeral 1515, is preferably supplied to datastorage and processing circuitry 1516, which preferably carries outfunctionality “C” described hereinabove with reference to FIG. 1A,providing an output indicating at least one and possibly both of thephase and the amplitude of the surface mapping wavefront. This output ispreferably further processed to obtain information about the surface1506, such as geometrical variations and reflectivity of the surface.

In accordance with a preferred embodiment of the present invention, thebeam of radiation supplied from radiation source 1500 has a narrowwavelength band about a given central wavelength, causing the phase ofthe radiation reflected from surface 1506 to be proportional togeometrical variations in the surface 1506, the proportion being aninverse linear function of the central wavelength of the radiation.

In accordance with another preferred embodiment of the presentinvention, the beam of radiation supplied from radiation source 1500 hasat least two narrow wavelength bands, each centered about a differentwavelength, designated λ₁, . . . , λ_(n). In such a case, the radiationreflected from the surface 1506 has at least two wavelength components,each centered around a wavelength λ₁, . . . , λ_(n) and at least twoindications of the phase of the surface mapping wavefront are obtained.Each such indication corresponds to a different wavelength component ofthe reflected radiation. These at least two indications may besubsequently combined to enable enhanced mapping of the surface 1506, byavoiding ambiguity in the mapping, known as 2π ambiguity, when the valueof the mapping at a given spatial location in the surface exceeds thevalue of the mapping at a different spatial location in the surface bythe largest of the different wavelengths λ₁, . . . , λ_(n). A properchoice, of the wavelengths λ₁, . . . , λ_(n), may lead to elimination ofthis ambiguity when the difference in values of the mapping at differentlocations is smaller than the multiplication product of all thewavelengths.

In accordance with still another preferred embodiment of the presentinvention, the phase manipulator 1510 applies a plurality of differentspatial phase changes to the radiation wavefront reflected from surface1506 and Fourier transformed by lens 1508. Application of the pluralityof different spatial phase changes provides a plurality of differentlyphase changed transformed wavefronts which may be subsequently detectedby detector 1514.

In accordance with yet another preferred embodiment of the presentinvention, at least three different spatial phase changes are applied byphase manipulator 1510, resulting in at least three different intensitymaps 1515. The at least three intensity maps are employed by the datastorage and processing circuitry 1516 to obtain an output indicating atleast the phase of the surface mapping wavefront. In such a case, thedata storage and processing circuitry 1516, carries out functionality“C” described hereinabove with reference to FIG. 1A, preferably in amanner described hereinabove with reference to FIG. 13, where thewavefront being analyzed (FIG. 13) is the surface mapping wavefront.

Additionally, in accordance with a preferred embodiment of the presentinvention, the beam of radiation supplied from radiation source 1500comprises a plurality of different wavelength components, therebyproviding a plurality of wavelength components in the surface mappingwavefront and subsequently in the transformed wavefront impinging onphase manipulator 1510. In this case the phase manipulator may be anobject, at least one of whose thickness, refractive index and surfacegeometry varies spatially. This spatial variance of the phasemanipulator generates a different spatial phase change for each of thewavelength components, thereby providing a plurality of differentlyphase changed transformed wavefronts to be subsequently detected bydetector 1514.

Reference is now made to FIG. 16, which is a simplified partiallyschematic, partially pictorial illustration of a system for objectinspection employing the functionality and structure of FIGS. 1A and 1B.As seen in FIG. 16, a beam of radiation, such as light or acousticenergy, is supplied from a radiation source 1600, optionally via a beamexpander, onto at least partially transparent object to be inspected1602. The radiation transmitted through the inspected object 1602, is anobject inspection wavefront, which has an amplitude and a phase, andwhich contains information about the object 1602. At least part of theradiation transmitted through object 1602 is focused via a focusing lens1604 onto a phase manipulator 1606, which is preferably located at theimage plane of radiation source 1600.

The phase manipulator 1606 may be, for example, a spatial lightmodulator or a series of different transparent, spatially non-uniformobjects. It is appreciated that phase manipulator 1606 can be configuredsuch that a substantial part of the radiation focused thereonto isreflected therefrom. Alternatively the phase manipulator 1606 can beconfigured such that a substantial part of the radiation focusedthereonto is transmitted therethrough.

A second lens 1608 is arranged so as to image object 1602 onto adetector 1610, such as a CCD detector. Preferably, the second lens 1608is arranged such that the detector 1610 lies in its focal plane. Theoutput of detector 1610, an example of which is a set of intensity mapsdesignated by reference numeral 1612, is preferably supplied to datastorage and processing circuitry 1614, which preferably carries outfunctionality “C” described hereinabove with reference to FIG. 1A,providing an output indicating at least one and possibly both of thephase and the amplitude of the object inspection wavefront. This outputis preferably further processed to obtain information about the object1602, such as a mapping of the object's thickness, refractive index ortransmission.

In accordance with one preferred embodiment of the present invention,the beam of radiation supplied from radiation source 1600 has a narrowwavelength band about a given central wavelength, and the object 1602 issubstantially uniform in material and other optical properties, causingthe phase of the radiation transmitted through object 1602 to beproportional to thickness of the object 1602.

In accordance with one more preferred embodiment of the presentinvention, the beam of radiation supplied from radiation source 1600 hasa narrow wavelength band about a given central wavelength, and theobject 1602 is substantially uniform in thickness, causing the phase ofthe radiation transmitted through object 1602 to be proportional tooptical properties, such as refraction index or density, of the object1602. It is appreciated that object 1602 may be any optical conductionelement, such as an optical fiber.

In accordance with another preferred embodiment of the presentinvention, the beam of radiation supplied from radiation source 1600 hasat least two narrow wavelength bands, each centered about a differentwavelength, designated λ₁, . . . , λ_(n). In such a case, the radiationtransmitted through object 1602 has at least two wavelength components,each centered around a wavelength λ₁, . . . , λ_(n) and at least twoindications of the phase of the object inspection wavefront areobtained. Each such indication corresponds to a different wavelengthcomponent of the transmitted radiation. These at least two indicationsmay be subsequently combined to enable enhanced mapping of theproperties, such as thickness, of object 1602, by avoiding ambiguity inthe mapping, known as 2π ambiguity, when the value of the mapping at agiven spatial location in the object exceeds the value of the mapping ata different spatial location in the object by the largest of thedifferent wavelengths λ₁, . . . , λ_(n). A proper choice of thewavelengths λ₁, . . . , λ_(n), may lead to elimination of this ambiguitywhen the difference in values of the mapping at different locations issmaller than the multiplication product of all the wavelengths.

In accordance with still another preferred embodiment of the presentinvention, the phase manipulator 1606 applies a plurality of differentspatial phase changes to the radiation wavefront transmitted throughobject 1602 and Fourier transformed by lens 1604. Application of theplurality of different spatial phase changes produces a plurality ofdifferently phase changed transformed wavefronts which may besubsequently detected by detector 1610.

In accordance with yet another preferred embodiment of the presentinvention, at least three different spatial phase changes are applied byphase manipulator 1606, resulting in at least three different intensitymaps 1612. The at least three intensity maps 1612 are employed by thedata storage and processing circuitry 1614 to obtain an outputindicating at least the phase of the object inspection wavefront. Insuch a case, the data storage and processing circuitry 1614, carries outfunctionality “C” described hereinabove with reference to FIG. 1A,preferably in a manner described hereinabove with reference to FIG. 13,where the wavefront being analyzed (FIG. 13) is the object inspectionwavefront.

Additionally, in accordance with a preferred embodiment of the presentinvention, the beam of radiation supplied from radiation source 1600comprises a plurality of different wavelength components, therebyproviding a plurality of wavelength components in the object inspectionwavefront and subsequently in the transformed wavefront impinging onphase manipulator 1606. In this case the phase manipulator 1606 may bean object, at least one of whose thickness, refractive index and surfacegeometry varies spatially. This spatial variance of the phasemanipulator generates a different spatial phase change for each of thewavelength components, thereby providing a plurality of differentlyphase changed transformed wavefronts to be subsequently detected bydetector 1610.

Reference is now made to FIG. 17, which is a simplified partiallyschematic, partially pictorial illustration of a system for spectralanalysis employing the functionality and structure of FIGS. 1A and 1B.As seen in FIG. 17, a beam of radiation, such as light or acousticenergy, is supplied from a radiation source to be tested 1700,optionally via a beam expander, onto a known element 1702, such as anEtalon or a plurality of Etalons. Element 1702 is intended to generatean input wavefront, having at least varying phase or intensity. Theradiation transmitted through the element 1702, is a spectral analysiswavefront, which has an amplitude and a phase, and which containsinformation about the spectrum of the radiation source 1700. At leastpart of the radiation transmitted through element 1702 is focused via afocusing lens 1704 onto a phase manipulator 1706, which is preferablylocated at the image plane of radiation source 1700.

The phase manipulator 1706 may be, for example, a spatial lightmodulator or a series of different transparent, spatially non-uniformobjects. It is appreciated that phase manipulator 1706 can be configuredsuch that a substantial part of the radiation focused thereonto isreflected therefrom. Alternatively the phase manipulator 1706 can beconfigured such that a substantial part of the radiation focusedthereonto is transmitted therethrough.

A second lens 1708 is arranged so as to image element 1702 onto adetector 1710, such as a CCD detector. Preferably, the second lens 1708is arranged such that the detector 1710 lies in its focal plane. Theoutput of detector 1710, an example of which is a set of intensity mapsdesignated by reference numeral 1712, is preferably supplied to datastorage and processing circuitry 1714, which preferably carries outfunctionality “C” described hereinabove with reference to FIG. 1A,providing an output indicating at least one and possibly both of thephase and the amplitude of the spectral analysis wavefront. This outputis preferably further processed to obtain information about theradiation source 1700, such as the spectrum of the radiation suppliedfrom radiation source 1700.

In accordance with a preferred embodiment of the present invention, thespectral analysis wavefront is obtained by reflecting the radiationsupplied from radiation source 1700 from element 1702.

In accordance with another preferred embodiment of the presentinvention, the spectral analysis wavefront is obtained by transmittingthe radiation supplied from radiation source 1700 through element 1702.

In accordance with one more preferred embodiment of the presentinvention, the beam of radiation supplied from radiation source 1700 hasa narrow wavelength band about a central wavelength, causing the phaseof the radiation impinged on the object 1702 to be inverselyproportional to the central wavelength supplied from radiation source1700 and related to at least one of a surface characteristic andthickness of element 1702.

In accordance with another preferred embodiment of the presentinvention, the plurality of intensity maps 1712 are employed by the datastorage and processing circuitry 1714, to obtain an output indicating atleast one and possibly both of the phase and amplitude of the spectralanalysis wavefront by expressing the plurality of intensity maps as atleast one mathematical function of phase and amplitude of the spectralanalysis wavefront and of plurality of different phase changes appliedby phase manipulator 1706, wherein at least one and possibly both of thephase and amplitude is unknown and a function generating the differentphase changes is known. This at least one mathematical function issubsequently employed to obtain an output indicating at least the phaseof the spectral analysis wavefront.

In accordance with still another preferred embodiment of the presentinvention, the phase manipulator 1706 applies a plurality of differentspatial phase changes to the radiation wavefront transmitted throughelement 1702 and Fourier transformed by lens 1704. Application of theplurality of different spatial phase changes produces a plurality ofdifferently phase changed transformed wavefronts which may besubsequently detected by detector 1710.

In accordance with yet another preferred embodiment of the presentinvention, at least three different spatial phase changes are applied byphase manipulator 1706, resulting in at least three different intensitymaps 1712. The at least three intensity maps are employed by the datastorage and processing circuitry 1714 to obtain an output indicating atleast the phase of the spectral analysis wavefront. In such a case, thedata storage and processing circuitry 1714, carries out functionality“C” described hereinabove with reference to FIG. 1A, preferably in amanner described hereinabove with reference to FIG. 13, where thewavefront being analyzed (FIG. 13) is the spectral analysis wavefront.

Additionally, in accordance with a preferred embodiment of the presentinvention, the beam of radiation supplied from radiation source 1700comprises a plurality of different wavelength components, therebyproviding a plurality of wavelength components in the spectral analysiswavefront and subsequently in the transformed wavefront impinging onphase manipulator 1706. In this case the phase manipulator may be anobject, at least one of whose thickness, refractive index and surfacegeometry varies spatially. This spatial variance of the phasemanipulator generates a different spatial phase change for each of thewavelength components, thereby providing a plurality of differentlyphase changed transformed wavefronts to be subsequently detected bydetector 1710.

In accordance with an embodiment of the present invention, the phasemanipulator 1706 comprises a plurality of objects, each characterized inthat at least one of its thickness and refractive index variesspatially. The spatial variance of the thickness or of the refractiveindex of the plurality of objects may be selected in a way such that thephase changes applied by phase manipulator 1706 differ to a selectedpredetermined extent for at least some of the wavelength componentssupplied by radiation source 1700.

A specific selection of the objects is such that the phase changeapplied to an expected wavelength of radiation source differssubstantially from the phase change applied to an actual wavelength ofthe radiation source. Alternatively, the spatial variance of thethickness or refractive index of the plurality of objects may beselected in a way such that the phase changes applied by phasemanipulator 1706 are identical for at least some of the plurality ofdifferent wavelength components wavelength components supplied byradiation source 1700.

In accordance with another embodiment of the present invention, theknown element 1702 comprises a plurality of objects, each characterizedin that at least one of its thickness and refractive index variesspatially. The spatial variance of the thickness or of the refractiveindex of the plurality of objects may be selected in a way such that thewavelength components of the input wavefront, generated by passing thewavelength components of the radiation supplied by radiation source 1700through the element 1702, differ to a selected predetermined extent forat least some of the wavelength components supplied by radiation source1700.

A specific selection of the objects is such that the wavelengthcomponent of the input wavefront generated by an expected wavelength ofradiation source differs substantially from the wavelength component ofthe input wavefront generated by an actual wavelength of the radiationsource. Alternatively, the spatial variance of the thickness orrefractive index of the plurality of objects may be selected in a waysuch that the wavelength components of the input wavefront, generated bypassing the wavelength components of the radiation supplied by radiationsource 1700 through the element 1702, are identical for at least some ofthe wavelength components supplied by radiation source 1700.

Reference is now made to FIG. 18, which is a simplified partiallyschematic, partially pictorial illustration of a system for phase-changeanalysis employing the functionality and structure of FIGS. 1A and 1B.As seen in FIG. 18, a known wavefront 1800, which is a phase changeanalysis wavefront, having an amplitude and a phase, is focused via afocusing lens 1802, preferably performing a Fourier transform towavefront 1800, onto a phase manipulator 1804, which is preferablylocated at the focal plane of lens 1802. The phase manipulator applies aplurality of different phase changes to the transformed phase changeanalysis wavefront.

The phase manipulator 1804 may be, for example, a spatial lightmodulator or a series of different transparent, spatially non-uniformobjects. It is appreciated that phase manipulator 1804 can be configuredsuch that a substantial part of the radiation focused thereonto isreflected therefrom. Alternatively the phase manipulator 1804 can beconfigured such that a substantial part of the radiation focusedthereonto is transmitted therethrough.

A second lens 1806 is arranged so as to image wavefront 1800 onto adetector 1808, such as a CCD detector. Preferably, the second lens 1806is arranged such that the detector 1808 lies in its focal plane. Theoutput of detector 1808, an example of which is a set of intensity mapsdesignated by reference numeral 1810, is preferably supplied to datastorage and processing circuitry 1812, which employs the plurality ofintensity maps to obtain an output indication of differences between theplurality of different phase changes applied by the phase manipulator1804.

In accordance with one preferred embodiment of the present invention,lateral shifts appear in the plurality of different phase changes. Thesemay be produced, for example, by vibrations of the phase manipulator orby impurities in the phase manipulator. Consequently, correspondingchanges appear in the plurality of intensity maps 1810, and result inobtaining an indication of these lateral shifts.

In accordance with another preferred embodiment of the presentinvention, the plurality of intensity maps 1810 are employed by the datastorage and processing circuitry 1812 to obtain an output indicating thedifferences between the plurality of different phase changes applied bythe phase manipulator 1804, by expressing the plurality of intensitymaps as at least one mathematical function of phase and amplitude of thephase change analysis wavefront and of the plurality of different phasechanges applied by phase manipulator 1804, where at least the phase andamplitude of the wavefront 1800 are known and the plurality of differentphase changes are unknown. This at least one mathematical function issubsequently employed to obtain an output indicating at least thedifferences between the plurality of different phase changes.

In accordance with still another preferred embodiment of the presentinvention, the phase manipulator 1804 applies a plurality of differentspatial phase changes to the wavefront 1800 Fourier transformed by lens1802. Application of the plurality of different spatial phase changesprovides a plurality of differently phase changed transformed wavefrontswhich may be subsequently detected by detector 1808.

In accordance with yet another preferred embodiment of the presentinvention, at least three different spatial phase changes are applied byphase manipulator 1804, resulting in at least three different intensitymaps 1810. The at least three intensity maps are employed by the datastorage and processing circuitry 1812 to obtain an output indicating atleast the differences between the plurality of different phase changes.In such a case, the data storage and processing circuitry 1814, carriesout functionality “C” described hereinabove with reference to FIG. 1A,preferably in a manner similar to the manner described hereinabove withreference to FIG. 13, where the wavefront being analyzed (FIG. 13) isthe known phase change analysis wavefront, and the spatial phase changesapplied by phase manipulator 1804 are unknown.

Additionally, in accordance with a preferred embodiment of the presentinvention, the wavefront 1800 comprises a plurality of differentwavelength components, thereby providing a plurality of wavelengthcomponents in the transformed wavefront impinging on phase manipulator1804. In this case the phase manipulator may be an object, at least oneof whose thickness, refractive index and surface geometry variesspatially. This spatial variance of the phase manipulator generates adifferent spatial phase change for each of the wavelength components,thereby providing a plurality of differently phase changed transformedwavefronts to be subsequently detected by detector 1808.

Additionally, in accordance with another embodiment of the presentinvention, phase manipulator 1804 applies one phase change to theradiation focused onto each spatial location thereon, resulting in oneintensity map 1810, as an output of detector 1808. In such a case, thedata storage and processing circuitry 1812 employs the intensity map andthe known wavefront 1800 to obtain at least an output indicating thephase change applied by phase manipulator 1804.

In accordance with the foregoing methodology, the phase change appliedby the phase manipulator may be a phase delay, having a value selectedfrom one of a plurality of pre-determined values, including a possiblevalue of zero phase delay and the output indication of the phase changeobtained by data storage and processing circuitry 1812 is the value ofthe phase delay. In such a case, the phase manipulator may be mediawhich stores information by different values of the phase delays at eachof a multiplicity of different locations thereon, where the value of thephase delay constitutes the stored information. The stored information,encoded in the different values of the phase delays, is retrieved bydata storage and processing circuitry 1812. It is appreciated that insuch a case, wavefront 1800 may also comprise a plurality of different,wavelength components, resulting in a plurality of intensity maps andconsequently in an increase of the information encoded on the phasemanipulator at each of the multiplicity of different locations.

Reference is now made to FIG. 19, which is a simplified partiallyschematic, partially pictorial illustration of a system for stored dataretrieval employing the functionality and structure of FIGS. 1A and 1B.As seen in FIG. 19, optical storage media 1900, such as a DVD or compactdisk, has information encoded thereon by selecting the height of themedia at each of a multiplicity of different locations thereon, as shownin enlargement and designated by reference numeral 1902. At eachlocation on the media, the height of the media can be one of severalgiven heights or levels. The specific level of the media at thatlocation determines the information stored at that location.

A beam of radiation, such as light or acoustic energy, is supplied froma radiation source 1904, such as a laser or a LED, optionally via a beamexpander, onto a beam splitter 1906, which reflects at least part of theradiation onto the surface of the media 1900. The radiation reflectedfrom an area 1908 on the media, onto which the radiation impinges, is astored data retrieval wavefront, which has an amplitude and a phase, andwhich contains information stored in area 1908. At least part of theradiation incident on area 1908 is reflected from the area 1908 andtransmitted via the beam splitter 1906 onto an imaging system 1910,which may include a phase manipulator or other device which generates avarying phase function.

Imaging system 1910 preferably carries out functionalities “A” and “B”described hereinabove with reference to FIG. 1A, obtaining a pluralityof differently phase changed transformed wavefronts corresponding to thestored data retrieval wavefront and obtaining a plurality of intensitymaps of the plurality of phase changed transformed wavefronts.

Preferably, imaging system 1910 comprises a first lens 1508 (FIG. 15), aphase manipulator 1510 (FIG. 15), a second lens 1512 (FIG. 15) and adetector 1514 (FIG. 15). The outputs of imaging system 1910 are suppliedto data storage and processing circuitry 1912, which preferably carriesout functionality “C” described hereinabove with reference to FIG. 1A,providing an output indicating at least one and possibly both of thephase and amplitude of the stored data retrieval wavefront. This outputis preferably further processed to read out the information encoded inarea 1908 of media 1900 and displayed on display unit 1914.

In accordance with a preferred embodiment of the present invention, thebeam of radiation supplied from radiation source 1904 has a narrowwavelength band about a given central wavelength, causing the phase ofthe radiation reflected from media 1900 to be proportional togeometrical variations in the media 1900, which contain the encodedinformation, the proportion being an inverse linear function of thecentral wavelength of the radiation.

In accordance with another preferred embodiment of the presentinvention, the beam of radiation supplied from radiation source 1904 hasat least two narrow wavelength bands, each centered about a differentwavelength, designated λ₁, . . . , λ_(n). In such a case, the radiationreflected from area 1908 in media 1900 has at least two wavelengthcomponents, each centered around a wavelength λ₁, . . . , λ_(n).

At least two indications of the phase of the stored data retrievalwavefront are obtained, each such indication corresponding to adifferent wavelength component of the reflected radiation. These atleast two indications may be subsequently combined to enhance mapping ofthe surface of area 1908 of media 1900 and therefore enhance retrievalof the information, by avoiding an ambiguity in the mapping, known as 2πambiguity, when the value of the height of the media at a given locationexceeds the largest of the different wavelengths λ₁, . . . , λ_(n).

In such a case, the range of possible heights at each location in area1908 can exceed the value of the largest of the different wavelengths,without ambiguity in the reading of the heights. This extended dynamicrange enables storing more information on media 1900 than wouldotherwise be possible. A proper choice of the wavelengths λ₁, . . . ,λ_(n), may lead to elimination of this ambiguity when the difference ofheights of the media in area 1908 at different locations is smaller thanthe multiplication product of all the wavelengths.

In accordance with still another preferred embodiment of the presentinvention, a phase manipulator incorporated in imaging system 1910applies a plurality of different spatial phase changes to the radiationwavefront reflected from media 1900 and Fourier transformed by a lens,also incorporated in imaging system 1910. Application of the pluralityof different spatial phase changes provides a plurality of differentlyphase changed transformed wavefronts which may be subsequently detectedby a detector incorporated in imaging system 1910.

In accordance with yet another preferred embodiment of the presentinvention, at least three different spatial phase changes are applied bya phase manipulator incorporated in imaging system 1910, resulting in anoutput from imaging system 1910 of at least three different intensitymaps. The at least three intensity maps are employed by the data storageand processing circuitry 1912 to obtain an output indicating at leastthe phase of the stored data retrieval wavefront. In such a case, thedata storage and processing circuitry 1912, carries out functionality“C” described hereinabove with reference to FIG. 1A, preferably in amanner described hereinabove with reference to FIG. 13, where thewavefront being analyzed (FIG. 13) is the stored data retrievalwavefront.

Additionally, in accordance with an embodiment of the present invention,the beam of radiation supplied from radiation source 1904 comprises aplurality of different wavelength components, thereby providing aplurality of wavelength components in the stored data retrievalwavefront and subsequently in the transformed wavefront impinging on aphase manipulator incorporated into imaging system 1910. In this casethe phase manipulator may be an object, at least one of whose thickness,refractive index and surface geometry varies spatially. This spatialvariance of the phase manipulator generates a different spatial phasechange for each of the wavelength components, thereby providing aplurality of differently phase changed transformed wavefronts to besubsequently detected by a detector incorporated in imaging system 1910.

In accordance with another embodiment of the present invention,information is encoded on media 1900 by selecting the height of themedia at each given location to be such that the intensity value of theintensity map resulting from light reflected from the location andpassing through imaging system 1910 lies within a predetermined range ofvalues. This range corresponds to an element of the information storedat the location. By employing the plurality of intensity maps, multipleintensity values are realized for each location, each intensity valuelying within a specific range of values. The resulting plurality ofranges of intensity values provide multiple elements of information foreach location on the media 1900.

It is appreciated that in such a case, retrieving the information storedat area 1908 on the media from the outputs of imaging system 1910 may beperformed by data storage and processing circuitry 1912 in astraight-forward manner, as by mapping each of the resulting intensityvalues at each location to their corresponding ranges, and subsequentlyto the information stored at the location.

Preferably, the foregoing methodology also includes use of a phasemanipulator incorporated in imaging system 1910, that applies an atleast time-varying phase change function to the transformed dataretrieval wavefront impinging thereon. This time-varying phase changefunction provides the plurality of intensity maps.

Alternatively or additionally, the beam of radiation supplied fromradiation source 1904 comprises a plurality of different wavelengthcomponents, thereby providing a plurality of wavelength components inthe stored data retrieval wavefront. The plurality of differently phasechanged transformed wavefronts are obtained in imaging system 1910 byapplying at least one phase change to the plurality of differentwavelength components of the stored data retrieval wavefront. The phasechanged transformed stored data retrieval wavefront can be detected by asingle detector or alternatively separated, as by a dispersion element,into its separate plurality of different wavelength components, eachcomponent being detected by a different detector.

In accordance with yet another embodiment of the present invention,media 1900 may have different reflectivity coefficients for theradiation supplied from light source 1904 at each of a multiplicity ofdifferent locations on the media. At each location on the media, adifferent percentage of the radiation may be reflected. The percentagemay have one of several given values, where the specific value may atleast partially determine the information stored at that location.

In such a case, the information encoded on media 1900 may be encoded byselecting the height of the media at each of a multiplicity of differentlocations on the media and by selecting the reflectivity of the media ateach of a multiplicity of different locations on the media. In such acase, more information can be stored at each location on the media, thancould otherwise be stored. Furthermore, in such a case, employing anindication of the amplitude and phase of the stored data retrievalwavefront to obtain the encoded information includes employing theindication of the phase to obtain the information encoded by selectingthe height of the media and employing the indication of the amplitude toobtain said information encoded by selecting the reflectivity.

In accordance with still another embodiment of the present invention,the information is encoded onto media 1900 at several layers in themedia. The information is encoded on the media by selecting the heightof the media at each of multiplicity of different locations on eachlayer of the media. Each of these layers, placed one on top of the otherin media 1900, is partially reflecting and partially transmitting. Thebeam of radiation from source 1904 impinging onto media 1900 ispartially reflected from the top, first layer of the media, andpartially transmitted to the layers lying therebelow. The energytransmitted by the second layer is partially reflected and partiallytransmitted to the layers lying therebelow, and so on, until theradiation transmitted through all the layers is partially reflected fromthe undermost layer. In such a case, radiation source 1904 preferablyincludes a focusing system that focuses the radiation onto each one ofthe layers of media 1900 in order to retrieve the information stored onthat layer. Alternatively or additionally, imaging system 1910 mayinclude confocal microscopy elements operative to differentiate betweenthe different layers.

It is appreciated that area 1908 of media 1900 may be a relatively smallarea, comprising a single location on which information is encoded andpossibly also neighboring locations. In such a case, the detectorincorporated in imaging system 1910 may define only a single or severaldetection pixels. Additionally, the output indicating at least one andpossibly both of the phase and amplitude of the stored data retrievalwavefront provided by circuitry 1912, includes at least one and possiblyboth of the height of the media and the reflectivity of the media at thelocation or locations covered by area 1908.

In accordance with yet another embodiment of the present invention, thestored data retrieval wavefront comprises at least one one-dimensionalcomponent, corresponding to at least one one-dimensional part of area1908 on media 1900. In such a case, the imaging system 1910 ispreferably similar to the imaging system described hereinabove withreference to FIG. 10B. It preferably includes a first lens, such ascylindrical lens 1086 (FIG. 10B).

The first lens preferably produces a one-dimensional Fourier transform,performed along an axis extending perpendicularly to the direction ofpropagation of the data retrieval wavefront, thereby providing at leastone one-dimensional component of the transformed wavefront in adimension perpendicular to direction of propagation. The first lens,such as lens 1086, focuses the stored data retrieval wavefront onto aphase manipulator, such as a single axis displaceable phase manipulator1087 (FIG. 10B), which is preferably located at the focal plane of lens1086. The phase manipulator 1087 applies a plurality of different phasechanges to each of the at least one one-dimensional components of thetransformed wavefront, thereby obtaining at least one one-dimensionalcomponent of the plurality of phase changed transformed wave fronts.

Additionally the imaging system may include a second lens, such ascylindrical lens 1088 (FIG. 10B), arranged so as to image the at leastone one-dimensional component of the stored data retrieval wavefrontonto a detector 1089, such as a CCD detector. Additionally the pluralityof intensity maps are employed by circuitry 1912 to obtain an outputindicating al least one and possibly both of the amplitude and phase ofthe at least one one-dimensional component of the data retrievalwavefront.

Additionally, in accordance with the foregoing methodology, and asdescribed hereinabove with reference to FIG. 10B, the phase manipulator1087 preferably comprises a multiple local phase delay element, such asa spatially non-uniform transparent object, typically including severaldifferent phase delay regions, each arranged to apply a phase delay toone of the at least one one-dimensional component at a given position ofthe object along a phase manipulator axis, extending perpendicularly tothe direction of propagation of the wavefront and perpendicular to theaxis of the transform produced by lens 1086.

In such a case, there is provided relative movement between the imagingsystem 1910 and the media 1900 along the phase manipulator axis. Thisrelative movement sequentially matches different phase delay regionswith different wavefront components, corresponding to different parts ofarea 1908 on media 1900, such that preferably each wavefront componentpasses through each phase delay region of the phase manipulator.

It is appreciated that the relative movement between the imaging system1910 and the at least one one-dimensional wavefront component can beobtained by the rotation of media 1900 about its axis, while the imagingsystem is not moving.

It is a particular feature of this embodiment, that each of the at leastone one-dimensional component of the wavefront is separately processed.Thus, each of the at least one one-dimensional wavefront component,corresponding to a one-dimensional part of area 1908, is focused by aseparate portion of the first cylindrical lens of imaging system 1910,is imaged by a corresponding separate portion of the second cylindricallens and passes through a distinct region of the phase manipulator. Theimages of each of the one-dimensional parts of area 1908 at the detectorincorporated in imaging system 1910 are thus separate and distinctimages. It is appreciated that these images may appear on separatedetectors or on a monolithic detector.

In accordance with an embodiment of the present invention, the transformapplied to the stored data retrieval wavefront includes an additionalFourier transform. This additional Fourier transform may be performed bythe first cylindrical lens of imaging system 1910 or by an additionallens and is operative to minimize cross-talk between differentone-dimensional components of the wavefront. In such a case, preferablyan additional transform, such as that provided by an additional lensadjacent to the second cylindrical lens, is applied to the phase changedtransformed wavefront. In such a case, preferably a further transform isapplied to the phase changed transformed wavefront. This furthertransform may be performed by the second cylindrical lens of imagingsystem 1910 or by an additional lens.

Reference is now made to FIG. 20, which is a simplified partiallyschematic, partially pictorial illustration of a system for3-dimensional imaging employing the functionality and structure of FIGS.1A and 1B. As seen in FIG. 20, a beam of radiation, such as light oracoustic energy, is supplied from a radiation source 2000, optionallyvia a beam expander, onto a beam splitter 2004, which reflects at leastpart of the radiation onto a 3-dimensional object 2006 to be imaged. Theradiation reflected from the object 2006, is a 3-dimensional imagingwavefront, which has an amplitude and a phase, and which containsinformation about the object 2006. At least part of the radiationincident on the surface of object 2006 is reflected from the object 2006and transmitted via the beam splitter 2004 and focused via a focusinglens 2008 onto a phase manipulator 2010, which is preferably located atthe image plane of radiation source 2000.

The phase manipulator 2010 may be, for example, a spatial lightmodulator or a series of different transparent, spatially non-uniformobjects. It is appreciated that phase manipulator 2010 can be configuredsuch that a substantial part of the radiation focused thereonto isreflected therefrom. Alternatively the phase manipulator 2010 can beconfigured such that a substantial part of the radiation focusedthereonto is transmitted therethrough.

A second lens 2012 is arranged so as to image object 2006 onto adetector 2014, such as a CCD detector. Preferably the second lens 2012is arranged such that the detector 2014 lies in its focal plane. Theoutput of detector 2014, an example of which is a set of intensity mapsdesignated by reference numeral 2015, is preferably supplied to datastorage and processing circuitry 2016, which preferably carries outfunctionality “C” described hereinabove with reference to FIG. 1A,providing an output indicating at least one and possibly both of thephase and amplitude of the 3-dimensional imaging wavefront. This outputis preferably further processed to obtain information about the object2006, such as the 3-dimensional shape of the object.

In accordance with a preferred embodiment of the present invention, thebeam of radiation supplied from radiation source 2000 has a narrowwavelength band about a given central wavelength, causing the phase ofthe radiation reflected from object 2006 to be proportional togeometrical variations in the surface 2006, the proportion being aninverse linear function of the central wavelength of the radiation.

In accordance with another preferred embodiment of the presentinvention, the beam of radiation supplied from radiation source 2000 hasat least two narrow wavelength bands, each centered about a differentwavelength, designated λ₁, . . . , λ_(n). In such a case, the radiationreflected from the object 2006 has at least two wavelength components,each centered around a wavelength λ₁, . . . , λ_(n) and at least twoindications of the phase of the 3-dimensional imaging wavefront areobtained. Each such indication corresponds to a different wavelengthcomponent of the reflected radiation. These at least two indications maybe subsequently combined to enable enhanced imaging of the object 2006,by avoiding 2π ambiguity in the 3-dimensional imaging.

In accordance with still another preferred embodiment of the presentinvention, the phase manipulator 2010 applies a plurality of differentspatial phase changes to the radiation wavefront reflected from surface2006 and Fourier transformed by lens 2008. Application of the pluralityof different spatial phase changes provides a plurality of differentlyphase changed transformed wavefronts which may be subsequently detectedby detector 2014.

In accordance with yet another preferred embodiment of the presentinvention, at least three different spatial phase changes are applied byphase manipulator 2010, resulting in at least three different intensitymaps 2015. The at least three intensity maps are employed by the datastorage and processing circuitry 2016 to obtain an output indicating atleast the phase of the 3-dimensional imaging wavefront. In such a case,the data storage and processing circuitry 2016, carries outfunctionality “C” described hereinabove with reference to FIG. 1A,preferably in a manner described hereinabove with reference to FIG. 13,where the wavefront being analyzed (FIG. 13) is the 3-dimensionalimaging wavefront.

Additionally, in accordance with a preferred embodiment of the presentinvention, the beam of radiation supplied from radiation source 2000comprises a plurality of different wavelength components, therebyproviding a plurality of wavelength components in the 3-dimensionalimaging wavefront and subsequently in the transformed wavefrontimpinging on phase manipulator 2010. In this case the phase manipulator2010 may be an object, at least one of whose thickness, refractive indexand surface geometry varies spatially. This spatial variance of thephase manipulator generates a different spatial phase change for each ofthe wavelength components, thereby providing a plurality of differentlyphase changed transformed wavefronts to be subsequently detected bydetector 2014.

Reference is now made to FIG. 21A, which is a simplified partiallyschematic, partially pictorial illustration of wavefront analysisfunctionality operative in accordance with another preferred embodimentof the present invention. The functionality of FIG. 21A can besummarized as including the following sub-functionalities:

-   A. obtaining a plurality of differently amplitude changed    transformed wavefronts corresponding to a wavefront being analyzed,    which has an amplitude and a phase;-   B. obtaining a plurality of intensity maps of the plurality of    amplitude changed transformed wavefronts; and-   C. employing the plurality of intensity maps to obtain an output    indicating at least one and possibly both of the phase and the    amplitude of the wavefront being analyzed.

As seen in FIG. 21A, the first sub-functionality, designated “A” may berealized by the following functionalities:

A wavefront, which may be represented by a plurality of point sources oflight, is generally designated by reference numeral 2100. Wavefront 2100has a phase characteristic which is typically spatially non-uniform,shown as a solid line and indicated generally by reference numeral 2102.Wavefront 2100 also has an amplitude characteristic which is typicallyspatially non-uniform, shown as a dashed line and indicated generally byreference numeral 2103. Such a wavefront may be obtained in aconventional manner by receiving light from any suitable object, such asby reading an optical disk, for example, a DVD or compact disk 2104.

A principal purpose of the present invention is to measure the phasecharacteristic, such as that indicated by reference numeral 2102, whichis not readily measured. Another purpose of the present invention is tomeasure the amplitude characteristic, such as that indicated byreference numeral 2103 in an enhanced manner. A further purpose of thepresent invention is to measure both the phase characteristic 2102 andthe amplitude characteristic 2103. While there exist various techniquesfor carrying out such measurements, the present invention provides amethodology which is believed to be superior to those presently known,inter alia due to its relative insensitivity to noise.

A transform, indicated here symbolically by reference numeral 2106, isapplied to the wavefront being analyzed 2100, thereby to obtain atransformed wavefront. A preferred transform is a Fourier transform. Theresulting transformed wavefront is symbolically indicated by referencenumeral 2108.

A plurality of different amplitude changes, preferably spatial amplitudechanges, represented by optical attenuation components 2110, 2112 and2114 are applied to the transformed wavefront 2108, thereby to obtain aplurality of differently amplitude changed transformed wavefronts,represented by reference numerals 2120, 2122 and 2124 respectively. Itis appreciated that the illustrated difference between the individualones of the plurality of differently amplitude changed transformedwavefronts is that portions of the transformed wavefront are attenuateddifferently relative to the remainder thereof.

As seen in FIG. 21A, the second sub-functionality, designated “B”, maybe realized by applying a transform, preferably a Fourier transform, tothe plurality of differently amplitude changed transformed wavefronts.Alternatively, the sub-functionality B may be realized without the useof a Fourier transform, such as by propagation of the differentlyamplitude changed transformed wavefronts over an extended space.Finally, functionality B requires detection of the intensitycharacteristics of plurality of differently amplitude changedtransformed wavefronts. The outputs of such detection are the intensitymaps, examples of which are designated by reference numerals 2130, 2132and 2134.

As seen in FIG. 21A, the third sub-functionality, designated “C” may berealized by the following functionalities:

-   -   expressing, such as by employing a computer 2136, the plurality        of intensity maps, such as maps 2130, 2132 and 2134, as at least        one mathematical function of phase and amplitude of the        wavefront being analyzed and of the plurality of different        amplitude changes, wherein at least one and possibly both of the        phase and the amplitude are unknown and the plurality of        different amplitude changes, typically represented by optical        attenuation components 2110, 2112 and 2114 applied to the        transformed wavefront 2108, are known; and    -   employing, such as by means of the computer 2136, the at least        one mathematical function to obtain an indication of at least        one and possibly both of the phase and the amplitude of the        wavefront being analyzed, here represented by the phase function        designated by reference numeral 2138 and the amplitude function        designated by reference numeral 2139, which, as can be seen,        respectively represent the phase characteristics 2102 and the        amplitude characteristics 2103 of the wavefront 2100. In this        example, wavefront 2100 may represent the information contained        in the compact disk or DVD 2104.

In accordance with an embodiment of the present invention, the pluralityof intensity maps comprises at least four intensity maps. In such acase, employing the plurality of intensity maps to obtain an outputindicating at least the phase of the wavefront being analyzed includesemploying a plurality of combinations, each of at least three of theplurality of intensity maps, to provide a plurality of indications atleast of the phase of the wavefront being analyzed.

Preferably, the methodology also includes employing the plurality ofindications of at least the phase of the wavefront being analyzed toprovide an enhanced indication at least of the phase of the wavefrontbeing analyzed.

Also in accordance with an embodiment of the present invention, theplurality of intensity maps comprises at least four intensity maps. Insuch a case, employing the plurality of intensity maps to obtain anoutput indicating at least the amplitude of the wavefront being analyzedincludes employing a plurality of combinations, each of at least threeof the plurality of intensity maps, to provide a plurality ofindications at least of the amplitude of the wavefront being analyzed.

Preferably, the methodology also includes employing the plurality ofindications of at least the amplitude of the wavefront being analyzed toprovide an enhanced indication at least of the amplitude of thewavefront being analyzed.

It is appreciated that in this manner, enhanced indications of bothphase and amplitude of the wavefront may be obtained.

In accordance with a preferred embodiment of the present invention, atleast some of the plurality of indications of the amplitude and phaseare at least second order indications of the amplitude and phase of thewavefront being analyzed.

In accordance with one preferred embodiment of the present invention,the plurality of intensity maps are employed to provide an analyticaloutput indicating the amplitude and phase.

Preferably, the amplitude changed transformed wavefronts are obtained byinterference of the wavefront being analyzed along a common opticalpath.

In accordance with another preferred embodiment of the presentinvention, the plurality of intensity maps are employed to obtain anoutput indicating the phase of the wavefront being analyzed, which issubstantially free from halo and shading off distortions, which arecharacteristic of many of the existing ‘phase-contrast’ methods.

In accordance with still another embodiment of the present invention,the plurality of intensity maps may be employed to obtain an outputindicating the phase of the wavefront being analyzed by combining theplurality of intensity maps into a second plurality of combinedintensity maps, the second plurality being less than the firstplurality, obtaining at least an output indicative of the phase of thewavefront being analyzed from each of the second plurality of combinedintensity maps and combining the outputs to provide an enhancedindication of the phase of the wavefront being analyzed.

In accordance with yet another embodiment of the present invention, theplurality of intensity maps may be employed to obtain an outputindicating amplitude of the wavefront being analyzed by combining theplurality of intensity maps into a second plurality of combinedintensity maps, the second plurality being less than the firstplurality, obtaining at least an output indicative of the amplitude ofthe wavefront being analyzed from each of the second plurality ofcombined intensity maps and combining the outputs to provide an enhancedindication of the amplitude of the wavefront being analyzed.

Additionally in accordance with a preferred embodiment of the presentinvention, the foregoing methodology may be employed for obtaining aplurality of differently amplitude changed transformed wavefrontscorresponding to a wavefront being analyzed, obtaining a plurality ofintensity maps of the plurality of amplitude changed transformedwavefronts and employing the plurality of intensity maps to obtain anoutput of an at least second order indication of phase of the wavefrontbeing analyzed.

Additionally or alternatively in accordance with a preferred embodimentof the present invention, the foregoing methodology may be employed forobtaining a plurality of differently amplitude changed transformedwavefronts corresponding to a wavefront being analyzed, obtaining aplurality of intensity maps of the plurality of amplitude changedtransformed wavefronts and employing the plurality of intensity maps toobtain an output of an at least second order indication of amplitude ofthe wavefront being analyzed.

In accordance with yet another embodiment of the present invention, theobtaining of the plurality of differently amplitude changed transformedwavefronts comprises applying a transform to the wavefront beinganalyzed, thereby to obtain a transformed wavefront, and then applying aplurality of different phase and amplitude changes to the transformedwavefront, where each of these changes can be a phase change, anamplitude change or a combined phase and amplitude change, thereby toobtain a plurality of differently phase and amplitude changedtransformed wavefronts.

In accordance with yet another embodiment of the present invention, awavefront being analyzed comprises at least two wavelength components.In such a case, obtaining a plurality of intensity maps also includesdividing the amplitude changed transformed wavefronts according to theat least two wavelength components in order to obtain at least twowavelength components of the amplitude changed transformed wavefrontsand in order to obtain at least two sets of intensity maps, each setcorresponding to a different one of the at least two wavelengthcomponents of the amplitude changed transformed wavefronts.

Subsequently, the plurality of intensity maps are employed to provide anoutput indicating the amplitude and phase of the wavefront beinganalyzed by obtaining an output indicative of the phase of the wavefrontbeing analyzed from each of the at least two sets of intensity maps andcombining the outputs to provide an enhanced indication of phase of thewavefront being analyzed. In the enhanced indication, there is no 2πambiguity once the value of the phase exceeds 2π, which conventionallyresults when detecting phase of a single wavelength wavefront.

It is appreciated that the wavefront being analyzed may be an acousticradiation wavefront.

It is also appreciated that the wavefront being analyzed may be anelectromagnetic radiation wavefront, of any suitable wavelength, such asvisible light, infrared, ultra-violet and X-ray radiation.

It is further appreciated that wavefront 2100 may be represented by arelatively small number of point sources and defined over a relativelysmall spatial region. In such a case, the detection of the intensitycharacteristics of the plurality of differently amplitude changedtransformed wavefronts may be performed by a detector comprising only asingle detection pixel or several detection pixels. Additionally, theoutput indicating at least one and possibly both of the phase andamplitude of the wavefront being analyzed may be provided by computer2136 in a straight-forward manner.

In accordance with an embodiment of the present invention, the pluralityof different amplitude changes 2110, 2112 and 2114, preferably spatialamplitude changes, are effected by applying a time-varying spatialamplitude change to part of the transformed wavefront 2108.

In accordance with a preferred embodiment of the present invention, theplurality of different amplitude changes 2110, 2112 and 2114 areeffected by applying a spatially uniform, time-varying spatial amplitudechange to part of the transformed wavefront 2108.

In accordance with an embodiment of the present invention, each of thewavefront 2100 and the transformed wavefront 2108 comprises a pluralityof different wavelength components. In such a case, the plurality ofdifferent spatial amplitude changes may be effected by applying anamplitude change to each of the plurality of different wavelengthcomponents of the transformed wavefront. It is appreciated that theamplitude changes may be spatially different or that the amplitude maybe differently attenuated for each different wavelength component.

In accordance with another embodiment of the present invention, each ofthe wavefront 2100 and the transformed wavefront 2108 comprises aplurality of different polarization components. In such a case, theplurality of different spatial amplitude changes may be effected byapplying an amplitude change to each of the plurality of differentpolarization components of the transformed wavefront. It is appreciatedthat the amplitude changes may be spatially different or that theamplitude may be differently attenuated for each different polarizationcomponent.

In accordance with another embodiment of the present invention, thetransform 2106 applied to the wavefront 2100 is a Fourier transform, theplurality of different spatial amplitude changes comprise at least threedifferent amplitude changes, effected by applying a spatially uniform,time-varying spatial amplitude attenuation to part of the transformedwavefront 2108, and the plurality of intensity maps 2130, 2132 and 2134comprises at least three intensity maps. In such a case, employing theplurality of intensity maps to obtain an output indicating the amplitudeand phase of the wavefront being analyzed preferably includes:

-   -   expressing the wavefront being analyzed 2100 as a first complex        function which has an amplitude and phase identical to the        amplitude and phase of the wavefront being analyzed;    -   expressing the plurality of intensity maps as a function of the        first complex function and of a spatial function governing the        spatially uniform, time-varying spatial amplitude change;    -   defining a second complex function, having an absolute value and        a phase, as a convolution of the first complex function and of a        Fourier transform of the spatial function governing the        spatially uniform, time-varying spatial amplitude attenuation;    -   expressing each of the plurality of intensity maps as a third        function of:        -   the amplitude of the wavefront being analyzed;        -   the absolute value of the second complex function;        -   a difference between the phase of the wavefront being            analyzed and the phase of the second complex function; and        -   a known amplitude attenuation produced by one of the at            least three different amplitude changes, to each of which            one of the at least three intensity maps corresponds;    -   solving the third function to obtain the amplitude of the        wavefront being analyzed, the absolute value of the second        complex function and the difference between the phase of the        wavefront being analyzed and the phase of the second complex        function;    -   solving the second complex function to obtain the phase of the        second complex function; and    -   obtaining the phase of the wavefront being analyzed by adding        the phase of the second complex function to the difference        between the phase of the wavefront being analyzed and the phase        of the second complex function.

Reference is now made to FIG. 21B, which is a simplified partiallyschematic, partially block diagram illustration of a wavefront analysissystem suitable for carrying out the functionality of FIG. 21A inaccordance with a preferred embodiment of the present invention. As seenin FIG. 21B, a wavefront, here designated by reference numeral 2150 isfocused, as by a lens 2152, onto an amplitude attenuator 2154, which ispreferably located at the focal plane of lens 2152. The amplitudeattenuator 2154 generates amplitude changes, such as amplitudeattenuation, and may be, for example, a spatial light modulator or aseries of different partially transparent objects.

A second lens 2156 is arranged so as to image wavefront 2150 onto adetector 2158, such as a CCD detector. Preferably the second lens 2156is arranged such that the detector 2158 lies in its focal plane. Theoutput of detector 2158 is preferably supplied to data storage andprocessing circuitry 2160, which preferably carries out functionality“C” described hereinabove with reference to FIG. 21A.

Reference is now made to FIG. 22, which is a simplified partiallyschematic, partially pictorial illustration of a system for surfacemapping employing the functionality and structure of FIGS. 21A and 21B.As seen in FIG. 22, a beam of radiation, such as light or acousticenergy, is supplied from a radiation source 2200, optionally via a beamexpander 2202, onto a beam splitter 2204, which reflects at least partof the radiation onto a surface 2206 to be inspected. The radiationreflected from the inspected surface, is a surface mapping wavefront,which has an amplitude and a phase, and which contains information aboutthe surface 2206. At least part of the radiation incident on surface2206 is reflected from the surface 2206 and transmitted via the beamsplitter 2204 and focused via a focusing lens 2208 onto an amplitudeattenuator 2210, which is preferably located at the image plane ofradiation source 2200.

The amplitude attenuator 2210 may be, for example, a spatial lightmodulator or a series of different partially transparent non-spatiallyuniform objects. It is appreciated that amplitude attenuator 2210 can beconfigured such that a substantial part of the radiation focusedthereonto is reflected therefrom. Alternatively the amplitude attenuator2210 can be configured such that a substantial part of the radiationfocused thereonto is transmitted therethrough.

A second lens 2212 is arranged so as to image surface 2206 onto adetector 2214, such as a CCD detector. Preferably the second lens 2212is arranged such that the detector 2214 lies in its focal plane. Theoutput of detector 2214, an example of which is a set of intensity mapsdesignated by reference numeral 2215, is preferably supplied to datastorage and processing circuitry 2216, which preferably carries outfunctionality “C” described hereinabove with reference to FIG. 21A,providing an output indicating at least one and possibly both of thephase and the amplitude of the surface mapping wavefront. This output ispreferably further processed to obtain information about the surface2206, such as geometrical variations and reflectivity of the surface.

In accordance with a preferred embodiment of the present invention, thebeam of radiation supplied from radiation source 2200 has a narrowwavelength band about a given central wavelength, causing the phase ofthe radiation reflected from surface 2206 to be proportional togeometrical variations in the surface 2206, the proportion being aninverse linear function of the central wavelength of the radiation.

In accordance with an embodiment of the present invention, the beam ofradiation supplied from radiation source 2200 has at least two narrowwavelength bands, each centered about a different wavelength, designatedλ₁, . . . , λ_(n). In such a case, the radiation reflected from thesurface 2206 has at least two wavelength components, each centeredaround a wavelength λ₁, . . . , λ_(n).

At least two indications of the phase of the surface mapping wavefrontare obtained. Each such indication corresponds to a different wavelengthcomponent of the reflected radiation. These at least two indications maybe subsequently combined to enable enhanced mapping of the surface 2206,by avoiding ambiguity in the mapping, known as 27 i ambiguity, when thevalue of the mapping at a given spatial location in the surface exceedsthe value of the mapping at a different spatial location in the surfaceby the largest of the different wavelengths λ₁, . . . , λ_(n). A properchoice of the wavelengths λ₁, . . . , λ_(n), may lead to elimination ofthis ambiguity when the difference in values of the mapping at differentlocations is smaller than the multiplication product of all thewavelengths.

In accordance with a preferred embodiment of the present invention, theamplitude attenuator 2210 applies a plurality of different spatialamplitude changes to the radiation wavefront reflected from surface 2206and Fourier transformed by lens 2208. Application of the plurality ofdifferent spatial amplitude changes provides a plurality of differentlyamplitude changed transformed wavefronts which may be subsequentlydetected by detector 2214.

In accordance with yet another preferred embodiment of the presentinvention, at least three different spatial amplitude changes areapplied by amplitude attenuator 2210, resulting in at least threedifferent intensity maps 2215. The at least three intensity maps areemployed by the data storage and processing circuitry 2216 to obtain anoutput indicating at least one and possibly both of the phase andamplitude of the surface mapping wavefront. In such a case, the datastorage and processing circuitry 2216, carries out functionality “C”described hereinabove with reference to FIG. 21A, where the wavefrontbeing analyzed (FIG. 21A) is the surface mapping wavefront.

Additionally, in accordance with a preferred embodiment of the presentinvention, the beam of radiation supplied from radiation source 2200comprises a plurality of different wavelength components, therebyproviding a plurality of wavelength components in the surface mappingwavefront and subsequently in the transformed wavefront impinging onamplitude attenuator 2210. In this case the amplitude attenuator may bean object, at least one of whose reflection and transmission variesspatially. This spatial variance of the amplitude attenuator generates adifferent spatial amplitude change for each of the wavelengthcomponents, thereby providing a plurality of differently amplitudechanged transformed wavefronts to be subsequently detected by detector2214. It is appreciated that the amplitude attenuation generated byattenuator 2210 may be different for each of the different wavelengthcomponents.

In accordance with an embodiment of the present invention, the surface2206 is a surface of media in which information is encoded by selectingthe height of the media at each of a multiplicity of different locationson the media. In such a case, the indications of the amplitude and phaseof the surface mapping wavefront provided by data storage and processingcircuitry 2216 are employed to obtain the information encoded on themedia.

It is appreciated that other applications, such as those describedhereinabove with respect to FIGS. 16-20 may also be provided inaccordance with the present invention wherein amplitude attenuation isperformed instead of phase manipulation. It is further appreciated thatall of the applications described hereinabove with reference to FIGS.15-20 may also be provided in accordance with the present inventionwherein both amplitude attenuation and phase manipulation are performed.

It will be appreciated by persons skilled in the art that the presentinvention is not limited by what has been particularly shown anddescribed hereinabove. Rather the present invention includes bothcombinations and subcombinations of features described hereinabove aswell as modifications and variations of such features which would occurto a person of ordinary skill in the art upon reading the foregoingdescription and which are not in the prior art.

1. A method of wavefront analysis comprising: utilizing a light sourceto illuminate an object and to generate a wavefront being analyzedhaving an amplitude and a phase; applying a transform to said wavefrontbeing analyzed, thereby to obtain a transformed wavefront; applying aplurality of different phase changes by applying a spatially uniformtime-varying spatial phase change to said transformed wavefront, therebyto obtain a plurality of differently phase changed transformedwavefronts; obtaining a plurality of intensity maps of said plurality ofdifferently phase changed transformed wavefronts; employing saidplurality of intensity maps to obtain an output indicating saidamplitude and phase of said wavefront being analyzed; wherein saidtransformed wavefront includes a non spatially modulated regionrepresenting an image of said light source, and a spatially modulatedregion and wherein said phase changes are applied to said spatiallymodulated region.
 2. An apparatus for wavefront analysis comprising: alight source to illuminate an object and to generate a wavefront beinganalyzed having an amplitude and a phase; a wavefront transformeroperating to transform said wavefront being analyzed, thereby to obtaina transformed wavefront, and to apply a plurality of different phasechanges by applying a spatially uniform time-varying spatial phasechange to said transformed wavefront, thereby to obtain a plurality ofdifferently phase changed transformed wavefronts; an intensity mapgenerator operating to provide a plurality of intensity maps of saidplurality of phase changed transformed wavefronts; an intensity maputilizer, employing the plurality of intensity maps for providing anoutput indicating the amplitude and phase of the wavefront beinganalyzed; wherein said transformed wavefront includes a non spatiallymodulated region representing an image of said light source, and aspatially modulated region and wherein said spatial phase changes areapplied to said spatially modulated region.
 3. A method of wavefrontanalysis comprising: applying a transform to a wavefront being analyzedwhich has an amplitude and a phase, thereby to obtain a transformedwavefront; obtaining a plurality of differently phase changedtransformed wavefronts by splitting the transformed wavefront intoseveral wavefronts, and applying spatial phase changes to each of saidseveral wavefronts; obtaining a plurality of intensity maps of saidplurality of differently phase changed transformed wavefronts; employingsaid plurality of intensity maps to obtain an output indicating saidamplitude and phase of said wavefront being analyzed; wherein each ofsaid spatial phase changes is generated by a different transparent,spatially non-uniform object.
 4. An apparatus for wavefront analysiscomprising: a wavefront transformer operating to transform saidwavefront being analyzed, thereby to obtain a transformed wavefront andto apply a plurality of different phase changes by splitting thetransformed wavefront into several wavefronts, and applying spatialphase changes to each of said several wavefronts; an intensity mapgenerator operating to provide a plurality of intensity maps of saidplurality of differently phase changed transformed wavefronts; anintensity map utilizer, employing said plurality of intensity maps forproviding an output indicating the amplitude and phase of the wavefrontbeing analyzed. wherein each of said spatial phase changes is generatedby a different transparent, spatially non-uniform object.
 5. A method ofwavefront analysis comprising: transmitting a wavefront being analyzed,which has an amplitude and a phase, through an imaging system to obtainan imaged wavefront, having amplitude and phase proportional to saidamplitude and phase of said wavefront being analyzed; obtaining aplurality of differently phase changed transformed wavefrontscorresponding to said imaged wavefront; obtaining a plurality ofintensity maps of said plurality of phase changed transformedwavefronts; and employing said plurality of intensity maps to obtain anoutput indicating said amplitude and phase of said wavefront beinganalyzed.
 6. An apparatus for wavefront analysis comprising: an imagingsystem, providing an imaged wavefront having amplitude and phase,proportional to amplitude and phase of a wavefront being analyzed; awavefront transformer operating to provide a plurality of differentlyphase changed transformed wavefronts corresponding to the imagedwavefront; an intensity map generator operating to provide a pluralityof intensity maps of said plurality of phase changed transformedwavefronts; an intensity map utilizer, employing the plurality ofintensity maps for providing an output indicating the amplitude andphase of the wavefront being analyzed.